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dc.contributor.authorCHOI, SI YOUNG-
dc.contributor.authorSIM, HYEJI-
dc.contributor.authorY. Park-
dc.contributor.author손준우-
dc.date.accessioned2023-09-01T08:23:23Z-
dc.date.available2023-09-01T08:23:23Z-
dc.date.created2023-08-08-
dc.date.issued2023-06-28-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/118637-
dc.languageEnglish-
dc.publisherInternational Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices-
dc.relation.isPartOfIAMnano2023-
dc.titleMoiré Charge Localization in Twisted Freestanding Oxide Membranes-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitationIAMnano2023-
dc.citation.conferenceDate2023-06-28-
dc.citation.conferencePlaceJA-
dc.citation.conferencePlaceVenue: Kunibiki Messe, Matsue, Shimane-
dc.citation.titleIAMnano2023-
dc.contributor.affiliatedAuthorCHOI, SI YOUNG-
dc.contributor.affiliatedAuthorSIM, HYEJI-
dc.contributor.affiliatedAuthor손준우-
dc.description.journalClass1-
dc.description.journalClass1-

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손준우SON, JUNWOO
Dept of Materials Science & Enginrg
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