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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | BAEK, ROCK HYUN | - |
| dc.contributor.author | DONG, HYUN KIM | - |
| dc.contributor.author | 남기훈 | - |
| dc.contributor.author | 박찬양 | - |
| dc.contributor.author | 양기호 | - |
| dc.contributor.author | 정진수 | - |
| dc.contributor.author | 이상욱 | - |
| dc.contributor.author | 임재완 | - |
| dc.date.accessioned | 2024-01-23T00:32:57Z | - |
| dc.date.available | 2024-01-23T00:32:57Z | - |
| dc.date.created | 2023-12-19 | - |
| dc.date.issued | 2023-02-15 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/119858 | - |
| dc.language | Korean | - |
| dc.publisher | KCS | - |
| dc.relation.isPartOf | 제 30회 한국반도체학술대회 | - |
| dc.title | Analysis of Mechanical Stress on Charge Trap Nitride (CTN) for Program Operation in 3D NAND Flash Memory | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | 제 30회 한국반도체학술대회 | - |
| dc.citation.conferenceDate | 2023-02-13 | - |
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | 제 30회 한국반도체학술대회 | - |
| dc.contributor.affiliatedAuthor | BAEK, ROCK HYUN | - |
| dc.contributor.affiliatedAuthor | DONG, HYUN KIM | - |
| dc.contributor.affiliatedAuthor | 남기훈 | - |
| dc.contributor.affiliatedAuthor | 박찬양 | - |
| dc.contributor.affiliatedAuthor | 양기호 | - |
| dc.contributor.affiliatedAuthor | 정진수 | - |
| dc.contributor.affiliatedAuthor | 이상욱 | - |
| dc.contributor.affiliatedAuthor | 임재완 | - |
| dc.description.journalClass | 2 | - |
| dc.description.journalClass | 2 | - |
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Related Researcher
- 백록현BAEK, ROCK HYUN
- Dept of Electrical Enginrg