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Clear evidence for strain changes according to Co layer thickness in metastable Co/Pd(111) multilayers: An extended x-ray absorption fine structure study SCIE SCOPUS

Title
Clear evidence for strain changes according to Co layer thickness in metastable Co/Pd(111) multilayers: An extended x-ray absorption fine structure study
Authors
Kim, SKKoo, YMChernov, VAPadmore, H
Date Issued
1996-04-15
Publisher
AMERICAN PHYSICAL SOC
Abstract
We have measured fluorescence-yield extended x-ray absorption fine structure (EXAFS) on a series of (Co x Angstrom+Pd 11 Angstrom)(13) metallic multilayers. To examine the local atomic structure around Co and its anisotropy, Co K-edge EXAFS measurements were performed at near-grazing incidence of synchrotron radiation incorporating linear polarization dependence. We generally observed, with decreasing Co layer thickness, increasing, in-plane interatomic distance and decreasing, out-of-plane interatomic distance in Co atoms. For a (Co 10 Angstrom +Pd 11 Angstrom)(13) multilayer, strain values of in-plane and out-of-plane Co atoms are estimated to be 3.6+/-0.5% in tensile and 3.0+/-0.4% in compressive strain.
URI
https://oasis.postech.ac.kr/handle/2014.oak/12001
DOI
10.1103/PhysRevB.53.11114
ISSN
0163-1829
Article Type
Article
Citation
PHYSICAL REVIEW B, vol. 53, no. 16, page. 11114 - 11119, 1996-04-15
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구양모KOO, YANG MO
Ferrous & Energy Materials Technology
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