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dc.contributor.authorKIM, SANG WOO-
dc.contributor.authorBUM, JUN KIM-
dc.contributor.authorHYEYEON, CHOI-
dc.contributor.authorJANG, HYEONAH-
dc.contributor.authorLEE, DONGGEON-
dc.date.accessioned2024-02-08T01:23:56Z-
dc.date.available2024-02-08T01:23:56Z-
dc.date.created2024-02-01-
dc.date.issued2023-08-03-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/120127-
dc.languageEnglish-
dc.publisherAssociation for Uncertainty in Artificial Intelligence (AUAI)-
dc.relation.isPartOf39th Conference on Uncertainty in Artificial Intelligence (UAI)-
dc.relation.isPartOfProceedings of the Thirty-Ninth Conference on Uncertainty in Artificial Intelligence-
dc.titleHow to use dropout correctly on residual networks with batch normalization-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitation39th Conference on Uncertainty in Artificial Intelligence (UAI)-
dc.citation.conferenceDate2023-07-31-
dc.citation.conferencePlaceUS-
dc.citation.title39th Conference on Uncertainty in Artificial Intelligence (UAI)-
dc.contributor.affiliatedAuthorKIM, SANG WOO-
dc.contributor.affiliatedAuthorBUM, JUN KIM-
dc.contributor.affiliatedAuthorHYEYEON, CHOI-
dc.contributor.affiliatedAuthorJANG, HYEONAH-
dc.contributor.affiliatedAuthorLEE, DONGGEON-
dc.description.journalClass1-
dc.description.journalClass1-

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김상우KIM, SANG WOO
Dept of Electrical Enginrg
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