Anomalous Lattice Vibrations of Single- and Few-Layer MoS2
SCIE
SCOPUS
- Title
- Anomalous Lattice Vibrations of Single- and Few-Layer MoS2
- Authors
- Lee, Changgu; Yan, Hugen; Brus, Louis E.; Heinz, Tony F.; Hone, James; Ryu, Sunmin
- Date Issued
- 2010-05
- Publisher
- American Chemical Society (ACS)
- Abstract
- Molybdenum disulfide (MoS2) of single- and few-layer thickness was exfoliated on SiO2/Si substrate and characterized by Raman spectroscopy. The number of S-Mo-S layers of the samples was independently determined by contact-mode atomic force microscopy. Two Raman modes, E 12g and A1g, exhibited sensitive thickness dependence, with the frequency of the former decreasing and that of the latter increasing with thickness. The results provide a convenient and reliable means for determining layer thickness with atomic-level precision. The opposite direction of the frequency shifts, which cannot be explained solely by van der Waals interlayer coupling, is attributed to Coulombic interactions and possible stacking-induced changes of the intralayer bonding. This work exemplifies the evolution of structural parameters in layered materials in changing from the three-dimensional to the two-dimensional regime. © 2010 American Chemical Society.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/120207
- DOI
- 10.1021/nn1003937
- ISSN
- 1936-0851
- Article Type
- Article
- Citation
- ACS Nano, vol. 4, no. 5, page. 2695 - 2700, 2010-05
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- There are no files associated with this item.
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