DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Changgu | - |
dc.contributor.author | Yan, Hugen | - |
dc.contributor.author | Brus, Louis E. | - |
dc.contributor.author | Heinz, Tony F. | - |
dc.contributor.author | Hone, James | - |
dc.contributor.author | Ryu, Sunmin | - |
dc.date.accessioned | 2024-02-14T08:20:43Z | - |
dc.date.available | 2024-02-14T08:20:43Z | - |
dc.date.created | 2024-02-14 | - |
dc.date.issued | 2010-05 | - |
dc.identifier.issn | 1936-0851 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/120207 | - |
dc.description.abstract | Molybdenum disulfide (MoS2) of single- and few-layer thickness was exfoliated on SiO2/Si substrate and characterized by Raman spectroscopy. The number of S-Mo-S layers of the samples was independently determined by contact-mode atomic force microscopy. Two Raman modes, E 12g and A1g, exhibited sensitive thickness dependence, with the frequency of the former decreasing and that of the latter increasing with thickness. The results provide a convenient and reliable means for determining layer thickness with atomic-level precision. The opposite direction of the frequency shifts, which cannot be explained solely by van der Waals interlayer coupling, is attributed to Coulombic interactions and possible stacking-induced changes of the intralayer bonding. This work exemplifies the evolution of structural parameters in layered materials in changing from the three-dimensional to the two-dimensional regime. © 2010 American Chemical Society. | - |
dc.language | English | - |
dc.publisher | American Chemical Society (ACS) | - |
dc.relation.isPartOf | ACS Nano | - |
dc.title | Anomalous Lattice Vibrations of Single- and Few-Layer MoS<sub>2</sub> | - |
dc.type | Article | - |
dc.identifier.doi | 10.1021/nn1003937 | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | ACS Nano, v.4, no.5, pp.2695 - 2700 | - |
dc.identifier.wosid | 000277976900028 | - |
dc.citation.endPage | 2700 | - |
dc.citation.number | 5 | - |
dc.citation.startPage | 2695 | - |
dc.citation.title | ACS Nano | - |
dc.citation.volume | 4 | - |
dc.contributor.affiliatedAuthor | Ryu, Sunmin | - |
dc.identifier.scopusid | 2-s2.0-77952896966 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
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