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Note: Development of a wideband amplifier for cryogenic scanning tunneling microscopy SCIE SCOPUS

Title
Note: Development of a wideband amplifier for cryogenic scanning tunneling microscopy
Authors
Zhang, ChaoJeon, HoyeonOh, MyungchulLee, MinjunKim, SungminYi, SunwoukLee, HanhoZoh, InhaeYoo, YongchanKuk, Young
Date Issued
2017-06
Publisher
American Institute of Physics
Abstract
A wideband cryogenic amplifier has been developed for low temperature scanning tunneling microscopy. The amplifier consisting of a wideband complementary metal oxide semiconductor field effect transistors operational amplifier together with a feedback resistor of 100 kΩ and a capacitor is mounted within a 4 K Dewar. This amplifier has a wide bandwidth and is successfully applied to scanning tunneling microscopy applications at low temperatures down to ∼7 K. The quality of the designed amplifier is validated by high resolution imaging. More importantly, the amplifier has also proved to be capable of performing scanning tunneling spectroscopy measurements, showing the detection of the Shockley surface state of the Au(111) surface and the superconducting gap of Nb(110).
URI
https://oasis.postech.ac.kr/handle/2014.oak/120658
DOI
10.1063/1.4990041
ISSN
0034-6748
Article Type
Article
Citation
Review of Scientific Instruments, vol. 88, no. 6, 2017-06
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오명철OH, MYUNGCHUL
Department of Semiconductor Engineering
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