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dc.contributor.author이용수-
dc.contributor.authorHWANG, HYEON JUN-
dc.contributor.authorLEE, BYOUNG HUN-
dc.date.accessioned2024-03-06T01:17:36Z-
dc.date.available2024-03-06T01:17:36Z-
dc.date.created2024-02-21-
dc.date.issued2023-03-30-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/121368-
dc.publisherIEEE-
dc.relation.isPartOf2023 International Conference on Microelectronic Test Strucures-
dc.titleDemonstration of frequency doubler application using ZnO-DNTT anti-Ambipolar switch device-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitation2023 International Conference on Microelectronic Test Strucures-
dc.citation.conferenceDate2023-03-27-
dc.citation.conferencePlaceJA-
dc.citation.title2023 International Conference on Microelectronic Test Strucures-
dc.contributor.affiliatedAuthor이용수-
dc.contributor.affiliatedAuthorHWANG, HYEON JUN-
dc.contributor.affiliatedAuthorLEE, BYOUNG HUN-
dc.description.journalClass1-
dc.description.journalClass1-

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황현준HWANG, HYEON JUN
Dept of Electrical Enginrg
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