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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | MINJAE, KIM | - |
| dc.contributor.author | 이용수 | - |
| dc.contributor.author | HEEJIN, KWON | - |
| dc.contributor.author | JANGSEOP, LEE | - |
| dc.contributor.author | 김승모 | - |
| dc.contributor.author | 이해원 | - |
| dc.contributor.author | 전재현 | - |
| dc.contributor.author | 황현준 | - |
| dc.contributor.author | 황현상 | - |
| dc.contributor.author | LEE, BYOUNG HUN | - |
| dc.date.accessioned | 2024-03-06T01:18:23Z | - |
| dc.date.available | 2024-03-06T01:18:23Z | - |
| dc.date.created | 2024-02-21 | - |
| dc.date.issued | 2023-03-09 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/121375 | - |
| dc.publisher | IEEE | - |
| dc.relation.isPartOf | Electron Devices Technology and Manufacturing(EDTM) Confernce 2023 | - |
| dc.title | Channel thickness dependent optical bandgap observed from the p-type tellurium thin film transistor | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | Electron Devices Technology and Manufacturing(EDTM) Confernce 2023 | - |
| dc.citation.conferenceDate | 2023-03-07 | - |
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | Electron Devices Technology and Manufacturing(EDTM) Confernce 2023 | - |
| dc.contributor.affiliatedAuthor | MINJAE, KIM | - |
| dc.contributor.affiliatedAuthor | 이용수 | - |
| dc.contributor.affiliatedAuthor | HEEJIN, KWON | - |
| dc.contributor.affiliatedAuthor | JANGSEOP, LEE | - |
| dc.contributor.affiliatedAuthor | 김승모 | - |
| dc.contributor.affiliatedAuthor | 이해원 | - |
| dc.contributor.affiliatedAuthor | 전재현 | - |
| dc.contributor.affiliatedAuthor | 황현준 | - |
| dc.contributor.affiliatedAuthor | 황현상 | - |
| dc.contributor.affiliatedAuthor | LEE, BYOUNG HUN | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 황현상HWANG, HYUNSANG
- Dept of Materials Science & Enginrg