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Cited 13 time in webofscience Cited 14 time in scopus
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dc.contributor.authorChung, ON-
dc.contributor.authorKim, H-
dc.contributor.authorKoo, JY-
dc.contributor.authorChung, S-
dc.date.accessioned2015-06-25T03:04:00Z-
dc.date.available2015-06-25T03:04:00Z-
dc.date.created2009-03-19-
dc.date.issued2006-11-
dc.identifier.issn1098-0121-
dc.identifier.other2015-OAK-0000006403en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/12148-
dc.description.abstractWe have studied the coadsorption of NH3 molecules on the Si(001) surface using scanning tunneling microscopy. Three adsorption patterns are predominantly observed to be attributed to two NH3 molecules dissociated into NH2 and H. The most abundant one is a zigzag pattern where the dissociated NH2 groups reside on the alternating sides of a dimer row, which is followed by a combined adsorption of the on-dimer and the inter-dimer (ID) configuration. The last one is a linear pattern of the IDs. These observations suggest a substrate-mediated effective repulsion between NH2 groups.-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherAMERICAN PHYSICAL SOC-
dc.relation.isPartOfPHYSICAL REVIEW B-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleCoadsorption patterns of NH3 molecules on the Si(001) surface observed using scanning tunneling microscopy-
dc.typeArticle-
dc.contributor.college물리학과en_US
dc.identifier.doi10.1103/PhysRevB.74.193312-
dc.author.googleChung, ONen_US
dc.author.googleKim, Hen_US
dc.author.googleChung, Sen_US
dc.author.googleKoo, JYen_US
dc.relation.volume74en_US
dc.relation.issue19en_US
dc.contributor.id10071841en_US
dc.relation.journalPHYSICAL REVIEW Ben_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationPHYSICAL REVIEW B, v.74, no.19-
dc.identifier.wosid000242409200021-
dc.date.tcdate2019-01-01-
dc.citation.number19-
dc.citation.titlePHYSICAL REVIEW B-
dc.citation.volume74-
dc.contributor.affiliatedAuthorChung, S-
dc.identifier.scopusid2-s2.0-33751238183-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc13-
dc.type.docTypeArticle-
dc.subject.keywordPlusSI(100) SURFACE-
dc.subject.keywordPlusDISSOCIATIVE ADSORPTION-
dc.subject.keywordPlusELECTRONIC-STRUCTURE-
dc.subject.keywordPlusDEFECTS-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-

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