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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | LEE, JEONG SOO | - |
| dc.contributor.author | PARK, JOUNG HUN | - |
| dc.contributor.author | GILSANG, YOONGILSANG | - |
| dc.contributor.author | GO, DONGHYUN | - |
| dc.contributor.author | KIM, DONGHWI | - |
| dc.contributor.author | UKJU, AN | - |
| dc.contributor.author | KIM, JONG WOO | - |
| dc.contributor.author | KIM, JUNGSIK | - |
| dc.date.accessioned | 2024-03-06T06:09:14Z | - |
| dc.date.available | 2024-03-06T06:09:14Z | - |
| dc.date.created | 2024-03-04 | - |
| dc.date.issued | 2023-05-26 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/121684 | - |
| dc.language | English | - |
| dc.publisher | IEEE | - |
| dc.relation.isPartOf | IEEE International Reliability Physics Symposium (IRPS) | - |
| dc.title | Decomposition of Vertical and Lateral Charge Loss in Long-term Retention of 3-D NAND Flash Memory | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | IEEE International Reliability Physics Symposium (IRPS) | - |
| dc.citation.conferenceDate | 2023-05-26 | - |
| dc.citation.conferencePlace | US | - |
| dc.citation.title | IEEE International Reliability Physics Symposium (IRPS) | - |
| dc.contributor.affiliatedAuthor | LEE, JEONG SOO | - |
| dc.contributor.affiliatedAuthor | PARK, JOUNG HUN | - |
| dc.contributor.affiliatedAuthor | GILSANG, YOONGILSANG | - |
| dc.contributor.affiliatedAuthor | GO, DONGHYUN | - |
| dc.contributor.affiliatedAuthor | KIM, DONGHWI | - |
| dc.contributor.affiliatedAuthor | UKJU, AN | - |
| dc.contributor.affiliatedAuthor | KIM, JONG WOO | - |
| dc.contributor.affiliatedAuthor | KIM, JUNGSIK | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 이정수LEE, JEONG SOO
- Dept of Electrical Enginrg