Micrometer x-ray diffraction study of VO2 films: Separation between metal-insulator transition and structural phase transition
- Title
- Micrometer x-ray diffraction study of VO2 films: Separation between metal-insulator transition and structural phase transition
- Authors
- Kim, BJ; Lee, YW; 윤무현; Yun, HS; Shin, TJ; Kim, HT; Yun, SJ; Lim, JW; Choi, S
- Date Issued
- 2008-01
- Publisher
- AMER PHYSICAL SOC
- Abstract
- In order to clarify whether VO(2) is a Mott insulator or a Peierls insulator, the metal-insulator transition (MIT) and the structural phase transition (SPT) are simultaneously monitored for VO(2) films by current-voltage curve and diffraction measurements using a synchrotron micro-x-ray beam. In the regime showing a metallic conductivity below the SPT temperature (approximately 70 degrees C), only the diffraction planes of the monoclinic structure are observed, while planes of the tetragonal structure are absent. This observation reveals the presence of a monoclinic and metal phase between the MIT and the SPT as a characteristic of a Mott insulator.
- Keywords
- MOTT TRANSITION; BAND THEORY; VIEW; HUBBARD; PEIERLS; SPECTROSCOPY; VISUALIZATION
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/12187
- DOI
- 10.1103/PHYSREVB.77.
- ISSN
- 1098-0121
- Article Type
- Article
- Files in This Item:
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