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Cited 5 time in webofscience Cited 5 time in scopus
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dc.contributor.authorJung, SC-
dc.contributor.authorKang, MH-
dc.date.accessioned2015-06-25T03:07:50Z-
dc.date.available2015-06-25T03:07:50Z-
dc.date.created2012-03-22-
dc.date.issued2011-10-13-
dc.identifier.issn1098-0121-
dc.identifier.other2015-OAK-0000025039en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/12252-
dc.description.abstractTemperature-induced structural change of the Pb/Si(111)-root 7 x root 3 surface has been studied by using ab initio molecular dynamics simulations. The ordered root 7 x root 3 surface is found to evolve into a diffusive phase at elevated temperatures. Identified as responsible for the diffusive phase is a low-barrier concerted motion of two Pb atoms, one located on a hollow site and the other on an adjacent on-top site, which leads to an effective hollow-to-hollow Pb diffusion occurring in the background 1 x 1 lattice of the on-top Pb atoms. This diffusion picture explains well the "1 x 1" diffraction pattern with diffuse streaks observed in the high-temperature phase of the root 7 x root 3 surface and is proposed as the common structural and dynamical feature of all the high-temperature Pb/Si(111)-1 x 1 phases evolving from different ordered phases.-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherAmerican Physical Soc-
dc.relation.isPartOfPHYSICAL REVIEW B-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleDynamical nature of the high-temperature Pb/Si(111)-1×1 phase-
dc.typeArticle-
dc.contributor.college물리학과en_US
dc.identifier.doi10.1103/PHYSREVB.84.155422-
dc.author.googleJung, SCen_US
dc.author.googleKang, MHen_US
dc.relation.volume84en_US
dc.relation.issue15en_US
dc.relation.startpage155422en_US
dc.contributor.id10105469en_US
dc.relation.journalPHYSICAL REVIEW Ben_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationPHYSICAL REVIEW B, v.84, no.15, pp.155422-
dc.identifier.wosid000295872400011-
dc.date.tcdate2019-01-01-
dc.citation.number15-
dc.citation.startPage155422-
dc.citation.titlePHYSICAL REVIEW B-
dc.citation.volume84-
dc.contributor.affiliatedAuthorKang, MH-
dc.identifier.scopusid2-s2.0-80455156016-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc3-
dc.description.scptc2*
dc.date.scptcdate2018-06-152*
dc.type.docTypeArticle-
dc.subject.keywordPlusSURFACE SPECTROSCOPY-
dc.subject.keywordPlusPB-
dc.subject.keywordPlusSI(111)-
dc.subject.keywordPlusTRANSITIONS-
dc.subject.keywordPlusWAVE-
dc.subject.keywordPlusSTM-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-

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