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Statistical analysis of hard X-ray radiation at the PAL-XFEL facility performed by Hanbury Brown and Twiss interferometry SCIE SCOPUS

Title
Statistical analysis of hard X-ray radiation at the PAL-XFEL facility performed by Hanbury Brown and Twiss interferometry
Authors
KIM, YOUNG YONGKhubbutdinov, RuslanCarnis, JérômeKim, SangsooNam, DaewoongNam, InhyukKim, GyujinShim, Chi HyunYang, HaeryongCho, MyunghoonMin, Chang KiKim ChangbumKang, HeungSikVartanyants, Ivan A.
Date Issued
2022-11
Publisher
Blackwell Publishing Inc.
Abstract
A Hanbury Brown and Twiss interferometry experiment based on second-order correlations was performed at the PAL-XFEL facility. The statistical properties of the X-ray radiation were studied within this experiment. Measurements were performed at the NCI beamline at 10 keV photon energy under various operation conditions: self-amplified spontaneous emission (SASE), SASE with a monochromator, and self-seeding regimes at 120 pC, 180 pC and 200 pC electron bunch charge. Statistical analysis showed short average pulse duration from 6 fs to 9 fs depending on the operational conditions. A high spatial degree of coherence of about 70-80% was determined in the spatial domain for the SASE beams with the monochromator and self-seeding regime of operation. The obtained values describe the statistical properties of the beams generated at the PAL-XFEL facility.
URI
https://oasis.postech.ac.kr/handle/2014.oak/122955
DOI
10.1107/S1600577522008773
ISSN
0909-0495
Article Type
Article
Citation
Journal of Synchrotron Radiation, vol. 29, no. 6, page. 1465 - 1479, 2022-11
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김영용KIM, YOUNG YONG
Pohang Accelerator Laboratory
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