DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Jeehoon | - |
dc.contributor.author | Civale, L | - |
dc.contributor.author | Nazaretski, E | - |
dc.contributor.author | Haberkorn, N | - |
dc.contributor.author | Ronning, F | - |
dc.contributor.author | Sefat, A S | - |
dc.contributor.author | Tajima, T | - |
dc.contributor.author | Moeckly, B H | - |
dc.contributor.author | Thompson, J D | - |
dc.contributor.author | Movshovich, R | - |
dc.date.accessioned | 2024-08-19T04:40:07Z | - |
dc.date.available | 2024-08-19T04:40:07Z | - |
dc.date.created | 2024-08-19 | - |
dc.date.issued | 2012-11 | - |
dc.identifier.issn | 0953-2048 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/123920 | - |
dc.description.abstract | We present an experimental approach using magnetic force microscopy for measurements of the absolute value of the magnetic penetration depth lambda in superconductors. lambda is obtained in a simple and robust way without introducing any tip modeling procedure via direct comparison of the Meissner response curves for a material of interest to those measured for a reference sample. Using a well-characterized Nb film as a reference, we determine the absolute value of lambda in a Ba(Fe0.92Co0.08)(2)As-2 single crystal and a MgB2 thin film through a comparative experiment. Our apparatus features simultaneous loading of multiple samples, and allows straightforward measurement of the absolute value of lambda in superconducting thin film or single-crystal samples. | - |
dc.language | English | - |
dc.publisher | Institute of Physics Publishing | - |
dc.relation.isPartOf | Superconductor Science and Technology | - |
dc.title | Direct measurement of the magnetic penetration depth by magnetic force microscopy | - |
dc.type | Article | - |
dc.identifier.doi | 10.1088/0953-2048/25/11/112001 | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | Superconductor Science and Technology, v.25, no.11, pp.112001 | - |
dc.identifier.wosid | 000309959500001 | - |
dc.citation.number | 11 | - |
dc.citation.startPage | 112001 | - |
dc.citation.title | Superconductor Science and Technology | - |
dc.citation.volume | 25 | - |
dc.contributor.affiliatedAuthor | Kim, Jeehoon | - |
dc.identifier.scopusid | 2-s2.0-84867320253 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.type.docType | Article | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
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