DC Field | Value | Language |
---|---|---|
dc.contributor.author | KIM, JJ | - |
dc.contributor.author | LEE, HJ | - |
dc.date.accessioned | 2015-06-25T03:13:09Z | - |
dc.date.available | 2015-06-25T03:13:09Z | - |
dc.date.created | 2009-03-20 | - |
dc.date.issued | 1993-05-03 | - |
dc.identifier.issn | 0031-9007 | - |
dc.identifier.other | 2015-OAK-0000008715 | en_US |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/12399 | - |
dc.description.abstract | We measured low temperature conduction characteristics of amorphous indium/indium-oxide composite films deep in the insulating regime. Upon lowering temperature, resistance crosses over from an Efros-Shklovskii variable-range-hopping conduction to a simple activation conduction, with parameters in good agreement with the picture of hardening of a parabolic Coulomb gap near the Fermi level. In contrast to the previous observations in magnetic materials, however, the hard gap in our films is extremely insensitive to a magnetic field, which strongly indicates a nonmagnetic nature of the hard gap. | - |
dc.description.statementofresponsibility | open | en_US |
dc.language | English | - |
dc.publisher | AMERICAN PHYSICAL SOC | - |
dc.relation.isPartOf | PHYSICAL REVIEW LETTERS | - |
dc.rights | BY_NC_ND | en_US |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/2.0/kr | en_US |
dc.title | OBSERVATION OF A NONMAGNETIC HARD GAP IN AMORPHOUS IN/INOX FILMS IN THE HOPPING REGIME | - |
dc.type | Article | - |
dc.contributor.college | 물리학과 | en_US |
dc.identifier.doi | 10.1103/PhysRevLett.70.2798 | - |
dc.author.google | KIM, JJ | en_US |
dc.author.google | LEE, HJ | en_US |
dc.relation.volume | 70 | en_US |
dc.relation.startpage | 2798 | en_US |
dc.relation.lastpage | 2801 | en_US |
dc.contributor.id | 10080084 | en_US |
dc.relation.journal | PHYSICAL REVIEW LETTERS | en_US |
dc.relation.index | SCI급, SCOPUS 등재논문 | en_US |
dc.relation.sci | SCI | en_US |
dc.collections.name | Journal Papers | en_US |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | PHYSICAL REVIEW LETTERS, v.70, no.18, pp.2798 - 2801 | - |
dc.identifier.wosid | A1993KZ98900035 | - |
dc.citation.endPage | 2801 | - |
dc.citation.number | 18 | - |
dc.citation.startPage | 2798 | - |
dc.citation.title | PHYSICAL REVIEW LETTERS | - |
dc.citation.volume | 70 | - |
dc.contributor.affiliatedAuthor | LEE, HJ | - |
dc.identifier.scopusid | 2-s2.0-0002301174 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 28 | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | LOW-TEMPERATURE CONDUCTIVITY | - |
dc.subject.keywordPlus | COULOMB GAP | - |
dc.subject.keywordPlus | DISORDERED SYSTEMS | - |
dc.subject.keywordPlus | GLASS | - |
dc.relation.journalWebOfScienceCategory | Physics, Multidisciplinary | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Physics | - |
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