Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | CHO, HYEONSU | - |
| dc.contributor.author | JEONG, WOOJU | - |
| dc.contributor.author | CHOI, JOONYONG | - |
| dc.contributor.author | SEO, MYUNGHAE | - |
| dc.contributor.author | YOON, SOL | - |
| dc.contributor.author | LEE, SEUNGHO | - |
| dc.contributor.author | RIM, TAIUK | - |
| dc.contributor.author | BAEK, CHANG KI | - |
| dc.date.accessioned | 2024-09-24T06:27:33Z | - |
| dc.date.available | 2024-09-24T06:27:33Z | - |
| dc.date.created | 2024-09-24 | - |
| dc.date.issued | 2016-06-13 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/124256 | - |
| dc.publisher | IEIE | - |
| dc.relation.isPartOf | 2016 IEIE Conference ,The Institute of Electronics and Information Engineers | - |
| dc.title | Noise Characterization of Nanowire ISFET Sensor with Doping concentration | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | 2016 IEIE Conference ,The Institute of Electronics and Information Engineers | - |
| dc.citation.conferenceDate | 2016-06-11 | - |
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | 2016 IEIE Conference ,The Institute of Electronics and Information Engineers | - |
| dc.contributor.affiliatedAuthor | CHO, HYEONSU | - |
| dc.contributor.affiliatedAuthor | JEONG, WOOJU | - |
| dc.contributor.affiliatedAuthor | CHOI, JOONYONG | - |
| dc.contributor.affiliatedAuthor | SEO, MYUNGHAE | - |
| dc.contributor.affiliatedAuthor | YOON, SOL | - |
| dc.contributor.affiliatedAuthor | LEE, SEUNGHO | - |
| dc.contributor.affiliatedAuthor | RIM, TAIUK | - |
| dc.contributor.affiliatedAuthor | BAEK, CHANG KI | - |
| dc.description.journalClass | 2 | - |
| dc.description.journalClass | 2 | - |
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Related Researcher
- 백창기BAEK, CHANG KI
- Dept. Convergence IT Engineering