DC Field | Value | Language |
---|---|---|
dc.contributor.author | Hong, BH | - |
dc.contributor.author | Small, JP | - |
dc.contributor.author | Purewal, MS | - |
dc.contributor.author | Mullok | - |
dc.contributor.author | ov, A | - |
dc.contributor.author | Sfeir, MY | - |
dc.contributor.author | Wang, F | - |
dc.contributor.author | Lee, JY | - |
dc.contributor.author | Heinz, TF | - |
dc.contributor.author | Brus, LE | - |
dc.contributor.author | Kim, P | - |
dc.contributor.author | Kim, KS | - |
dc.date.accessioned | 2015-06-25T03:27:09Z | - |
dc.date.available | 2015-06-25T03:27:09Z | - |
dc.date.created | 2009-03-20 | - |
dc.date.issued | 2005-10-04 | - |
dc.identifier.issn | 0027-8424 | - |
dc.identifier.other | 2015-OAK-0000005450 | en_US |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/12736 | - |
dc.description.abstract | We report a simple but powerful method for engineering multi-walled carbon nanotubes (MWNTs) by using manipulation by an atomic-force microscope. The successive shell-by-shell extraction process of ultralong MWNTs allows the exposure of the innermost single-walled carbon nanotubes (SWNTs), which have diameters as small as approximate to 0.4 nm. The inner-shell extraction process changes the electrical characteristics of the MWNTs. Whereas the outer hollowed-out nanotubes show either metallic or semiconducting character, the innermost SWNTs of small diameter exhibit predominantly metallic transport properties. | - |
dc.description.statementofresponsibility | open | en_US |
dc.language | English | - |
dc.publisher | NATL ACAD SCIENCES | - |
dc.relation.isPartOf | PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA | - |
dc.rights | BY_NC_ND | en_US |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/2.0/kr | en_US |
dc.title | Extracting subnanometer single shells from ultralong multiwalled carbon nanotubes | - |
dc.type | Article | - |
dc.contributor.college | 화학과 | en_US |
dc.identifier.doi | 10.1073/PNAS.0505219102 | - |
dc.author.google | Hong, BH | en_US |
dc.author.google | Small, JP | en_US |
dc.author.google | Kim, KS | en_US |
dc.author.google | Kim, P | en_US |
dc.author.google | Brus, LE | en_US |
dc.author.google | Heinz, TF | en_US |
dc.author.google | Lee, JY | en_US |
dc.author.google | Wang, F | en_US |
dc.author.google | Sfeir, MY | en_US |
dc.author.google | Mullokandov, A | en_US |
dc.author.google | Purewal, MS | en_US |
dc.relation.volume | 102 | en_US |
dc.relation.issue | 40 | en_US |
dc.relation.startpage | 14155 | en_US |
dc.relation.lastpage | 14158 | en_US |
dc.contributor.id | 10051563 | en_US |
dc.relation.journal | PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA | en_US |
dc.relation.index | SCI급, SCOPUS 등재논문 | en_US |
dc.relation.sci | SCI | en_US |
dc.collections.name | Journal Papers | en_US |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, v.102, no.40, pp.14155 - 14158 | - |
dc.identifier.wosid | 000232392900008 | - |
dc.date.tcdate | 2019-01-01 | - |
dc.citation.endPage | 14158 | - |
dc.citation.number | 40 | - |
dc.citation.startPage | 14155 | - |
dc.citation.title | PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA | - |
dc.citation.volume | 102 | - |
dc.contributor.affiliatedAuthor | Kim, P | - |
dc.identifier.scopusid | 2-s2.0-26444616182 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 53 | - |
dc.description.scptc | 54 | * |
dc.date.scptcdate | 2018-10-274 | * |
dc.type.docType | Article | - |
dc.subject.keywordAuthor | atomic-force microscope | - |
dc.subject.keywordAuthor | double-walled carbon nanotube | - |
dc.subject.keywordAuthor | extraction | - |
dc.subject.keywordAuthor | single-walled carbon nanotube | - |
dc.subject.keywordAuthor | resonance Raman spectroscopy | - |
dc.relation.journalWebOfScienceCategory | Multidisciplinary Sciences | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
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