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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Classen, IGJ | - |
| dc.contributor.author | Boom, JE | - |
| dc.contributor.author | Suttrop, W | - |
| dc.contributor.author | Schmid, E | - |
| dc.contributor.author | Tobias, B | - |
| dc.contributor.author | Domier, CW | - |
| dc.contributor.author | Luhmann, NC | - |
| dc.contributor.author | Donne, AJH | - |
| dc.contributor.author | Jaspers, RJE | - |
| dc.contributor.author | de Vries, PC | - |
| dc.contributor.author | Park, HK | - |
| dc.contributor.author | Munsat, T | - |
| dc.contributor.author | Garcia-Munoz, M | - |
| dc.contributor.author | Schneider, PA | - |
| dc.date.accessioned | 2015-06-25T03:30:34Z | - |
| dc.date.available | 2015-06-25T03:30:34Z | - |
| dc.date.created | 2010-12-17 | - |
| dc.date.issued | 2010-10 | - |
| dc.identifier.issn | 0034-6748 | - |
| dc.identifier.other | 2015-OAK-0000022467 | en_US |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/12817 | - |
| dc.description.abstract | The newly installed electron cyclotron emission imaging diagnostic on ASDEX Upgrade provides measurements of the 2D electron temperature dynamics with high spatial and temporal resolution. An overview of the technical and experimental properties of the system is presented. These properties are illustrated by the measurements of the edge localized mode and the reversed shear Alfven eigenmode, showing both the advantage of having a two-dimensional (2D) measurement, as well as some of the limitations of electron cyclotron emission measurements. Furthermore, the application of singular value decomposition as a powerful tool for analyzing and filtering 2D data is presented. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3483214] | - |
| dc.description.statementofresponsibility | open | en_US |
| dc.language | English | - |
| dc.publisher | AMER INST PHYSICS | - |
| dc.relation.isPartOf | REVIEW OF SCIENTIFIC INSTRUMENTS | - |
| dc.rights | BY_NC_ND | en_US |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/2.0/kr | en_US |
| dc.title | 2D electron cyclotron emission imaging at ASDEX Upgrade (invited) | - |
| dc.type | Article | - |
| dc.contributor.college | 물리학과 | en_US |
| dc.identifier.doi | 10.1063/1.3483214 | - |
| dc.author.google | Classen, IGJ | en_US |
| dc.author.google | Boom, JE | en_US |
| dc.author.google | Schneider, PA | en_US |
| dc.author.google | Garcia-Munoz, M | en_US |
| dc.author.google | Munsat, T | en_US |
| dc.author.google | Park, HK | en_US |
| dc.author.google | de Vries, PC | en_US |
| dc.author.google | Jaspers, RJE | en_US |
| dc.author.google | Donne, AJH | en_US |
| dc.author.google | Luhmann, NC | en_US |
| dc.author.google | Domier, CW | en_US |
| dc.author.google | Tobias, B | en_US |
| dc.author.google | Schmid, E | en_US |
| dc.author.google | Suttrop, W | en_US |
| dc.relation.volume | 81 | en_US |
| dc.relation.issue | 10 | en_US |
| dc.contributor.id | 10192922 | en_US |
| dc.relation.journal | REVIEW OF SCIENTIFIC INSTRUMENTS | en_US |
| dc.relation.index | SCI급, SCOPUS 등재논문 | en_US |
| dc.relation.sci | SCI | en_US |
| dc.collections.name | Conference Papers | en_US |
| dc.type.rims | ART | - |
| dc.identifier.bibliographicCitation | REVIEW OF SCIENTIFIC INSTRUMENTS, v.81, no.10 | - |
| dc.identifier.wosid | 000283754000149 | - |
| dc.date.tcdate | 2019-01-01 | - |
| dc.citation.number | 10 | - |
| dc.citation.title | REVIEW OF SCIENTIFIC INSTRUMENTS | - |
| dc.citation.volume | 81 | - |
| dc.contributor.affiliatedAuthor | Park, HK | - |
| dc.identifier.scopusid | 2-s2.0-78149428244 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
| dc.description.wostc | 60 | - |
| dc.description.scptc | 78 | * |
| dc.date.scptcdate | 2018-10-274 | * |
| dc.type.docType | Article; Proceedings Paper | - |
| dc.relation.journalWebOfScienceCategory | Instruments & Instrumentation | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Instruments & Instrumentation | - |
| dc.relation.journalResearchArea | Physics | - |
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- 박현거PARK, HYEON KEO
- Dept of Physics