Maskless Plasmonic Lithography at 22 nm Resolution
SCIE
SCOPUS
- Title
- Maskless Plasmonic Lithography at 22 nm Resolution
- Authors
- Pan, L; Park, Y; Xiong, Y; Ulin-Avila, E; Wang, Y; Zeng, L; Xiong, SM; Rho, J; Sun, C; Bogy, DB; Zhang, X
- Date Issued
- 2011-11-29
- Publisher
- Nature Publishing Group
- Abstract
- Optical imaging and photolithography promise broad applications in nano-electronics, metrologies, and single-molecule biology. Light diffraction however sets a fundamental limit on optical resolution, and it poses a critical challenge to the down-scaling of nano-scale manufacturing. Surface plasmons have been used to circumvent the diffraction limit as they have shorter wavelengths. However, this approach has a trade-off between resolution and energy efficiency that arises from the substantial momentum mismatch. Here we report a novel multi-stage scheme that is capable of efficiently compressing the optical energy at deep sub-wavelength scales through the progressive coupling of propagating surface plasmons (PSPs) and localized surface plasmons (LSPs). Combining this with airbearing surface technology, we demonstrate a plasmonic lithography with 22 nm half-pitch resolution at scanning speeds up to 10 m/s. This low-cost scheme has the potential of higher throughput than current photolithography, and it opens a new approach towards the next generation semiconductor manufacturing.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/12876
- DOI
- 10.1038/SREP00175
- ISSN
- 2045-2322
- Article Type
- Article
- Citation
- SCIENTIFIC REPORTS, vol. 1, no. 175, 2011-11-29
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