Phase retrieval from exactly oversampled diffraction intensity through deconvolution
SCIE
SCOPUS
- Title
- Phase retrieval from exactly oversampled diffraction intensity through deconvolution
- Authors
- Song, CY; Ramunno-Johnson, D; Nishino, Y; Kohmura, Y; Ishikawa, T; Chen, CC; Lee, TK; Miao, JW
- Date Issued
- 2007-01
- Publisher
- AMERICAN PHYSICAL SOC
- Abstract
- We have shown that, when the linear oversampling ratio >= 2, exactly oversampled diffraction patterns can be directly obtained from measured data through deconvolution. By using computer simulations and experimental data, we have demonstrated that exact oversampling of diffraction patterns distinctively improves the quality of phase retrieval. Furthermore, phase retrieval based on the exact sampling scheme is independent of the oversampling ratio, which can significantly reduce the radiation dosage to the samples. We believe that the present work will contribute to high-quality image reconstruction of materials science samples and biological structures using x-ray diffraction microscopy.
- Keywords
- X-RAY-DIFFRACTION; RECONSTRUCTION; MICROSCOPY
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/13262
- DOI
- 10.1103/PHYSREVB.75.012102
- ISSN
- 1098-0121
- Article Type
- Article
- Citation
- PHYSICAL REVIEW B, vol. 75, no. 1, page. 12102, 2007-01
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