Microstructural evolution of a focused ion beam fabricated Mg nanopillar at high temperatures: Defect annihilation and sublimation
SCIE
SCOPUS
- Title
- Microstructural evolution of a focused ion beam fabricated Mg nanopillar at high temperatures: Defect annihilation and sublimation
- Authors
- Jeong, J; Subin Lee; Youbin Kim; Seung Min Han; Daniel Kiener; Youn-Bae Kang; Oh, SH
- Date Issued
- 2014-09-01
- Publisher
- PERGAMON-ELSEVIER SCIENCE LTD
- Abstract
- Microstructural evolution of focused ion beam machined Mg nanopillars was investigated by in situ heating experiments in a transmission electron microscope. The dislocation loops generated by a Ga+ ion beam were annihilated at around half of the melting point of Mg. At a higher temperature (673 K), the sublimation of Mg occurred due to the reduced stability of Mg under the vacuum environment. In the course of sublimation, the Ga-rich liquid was formed and stabilized the structural instability of moving solid-vapor interface. (C) 2014 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/13742
- DOI
- 10.1016/J.SCRIPTAMAT.2014.05.009
- ISSN
- 1359-6462
- Article Type
- Article
- Citation
- SCRIPTA MATERIALIA, vol. 86, page. 44 - 47, 2014-09-01
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