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Cited 6 time in webofscience Cited 7 time in scopus
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dc.contributor.authorIl-Min Yi-
dc.contributor.authorSoo-Min Lee-
dc.contributor.authorseungjun bae-
dc.contributor.authoryoungsoo sohn-
dc.contributor.authorjunghwan choi-
dc.contributor.authorKim, B-
dc.contributor.authorSim, JY-
dc.contributor.authorPark, HJ-
dc.date.accessioned2016-03-31T07:35:06Z-
dc.date.available2016-03-31T07:35:06Z-
dc.date.created2015-02-09-
dc.date.issued2014-12-
dc.identifier.issn1549-7747-
dc.identifier.other2014-OAK-0000031830-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/13791-
dc.description.abstractA switched-diode termination (SDT) is proposed to implement a low-power transceiver circuit for on-chip single-ended signaling through a through-silicon via (TSV). The channel signal swing is limited to 40 mV by the SDT to reduce the transmitter (TX) power. An inverter-cascade amplifier is used to reduce the receiver (RX) power. The SDT consists of an nMOS diode and a pMOS diode, which are connected in a series between power rails through the RX input node. Only one of these two diodes is switched on depending on the RX output data, which eliminates the short-circuit current of the center-tap resistor termination. Inverter feedback is applied to the cascade amplifier of the RX to increase the bandwidth from 0.9 to 5.0 GHz. The transceiver in the 65-nm CMOS process combined with an emulated five-stack TSV on the same chip works at 8 Gb/s with 149 fJ/b/pF and a 1.2-V supply.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherIEEE-
dc.relation.isPartOfCircuits and Systems II: Express Briefs, IEEE Transactions on-
dc.subjectEmulation-
dc.subjectlow-power input/output (I/O)-
dc.subjectlow-swing I/O-
dc.subjecton-chip I/O-
dc.subjecton-chip interconnect-
dc.subjectsingle-ended I/O-
dc.subjectthrough-silicon via (TSV)-
dc.subjectDESIGN-
dc.titleA 40-mV-Swing Single-Ended Transceiver for TSV with a Switched-Diode RX Termination-
dc.typeArticle-
dc.contributor.college전자전기공학과-
dc.identifier.doi10.1109/TCSII.2014.2362660-
dc.author.googleYi, IM-
dc.author.googleLee, SM-
dc.author.googleBae, SJ-
dc.author.googleSohn, YS-
dc.author.googleChoi, JH-
dc.author.googleKim, B-
dc.author.googleSim, JY-
dc.author.googlePark, HJ-
dc.relation.volume61-
dc.relation.issue12-
dc.relation.startpage987-
dc.relation.lastpage991-
dc.contributor.id10071836-
dc.relation.journalCircuits and Systems II: Express Briefs, IEEE Transactions on-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationCircuits and Systems II: Express Briefs, IEEE Transactions on, v.61, no.12, pp.987 - 991-
dc.identifier.wosid000345852200016-
dc.date.tcdate2019-01-01-
dc.citation.endPage991-
dc.citation.number12-
dc.citation.startPage987-
dc.citation.titleCircuits and Systems II: Express Briefs, IEEE Transactions on-
dc.citation.volume61-
dc.contributor.affiliatedAuthorKim, B-
dc.contributor.affiliatedAuthorSim, JY-
dc.contributor.affiliatedAuthorPark, HJ-
dc.identifier.scopusid2-s2.0-84914703202-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc3-
dc.description.scptc2*
dc.date.scptcdate2018-05-121*
dc.type.docTypeArticle-
dc.subject.keywordAuthorEmulation-
dc.subject.keywordAuthorlow-power input/output (I/O)-
dc.subject.keywordAuthorlow-swing I/O-
dc.subject.keywordAuthoron-chip I/O-
dc.subject.keywordAuthoron-chip interconnect-
dc.subject.keywordAuthorsingle-ended I/O-
dc.subject.keywordAuthorthrough-silicon via (TSV)-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-

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