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Cited 7 time in webofscience Cited 7 time in scopus
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dc.contributor.authorCho, J-
dc.contributor.authorSchubert, EF-
dc.contributor.authorSon, JK-
dc.contributor.authorKim, DY-
dc.contributor.authorKim, JK-
dc.date.accessioned2016-03-31T07:37:04Z-
dc.date.available2016-03-31T07:37:04Z-
dc.date.created2015-02-04-
dc.date.issued2014-11-
dc.identifier.issn1738-8090-
dc.identifier.other2014-OAK-0000031697-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/13827-
dc.description.abstractInvestigating the relationship between the breakdown voltage and the capacitance of GaInN light-emitting diodes (LEDs), we fmd that a lower capacitance due to weaker internal electric field in depletion region or wider depletion width at the pn junction results in lower reverse leakage current and thus larger breakdown voltage. The measured breakdown voltage and capacitance of LEDs show a strong correlation, opening a nondestructive and non-intrusive way to estimate the breakdown voltage of an LED based on the capacitance-voltage measurement.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherKOREAN INST METALS MATERIALS-
dc.relation.isPartOfELECTRONIC MATERIALS LETTERS-
dc.titleStrong Correlation between Capacitance and Breakdown Voltage of GaInN/GaN Light-Emitting Diodes-
dc.typeArticle-
dc.contributor.college신소재공학과-
dc.identifier.doi10.1007/S13391-014-4008-7-
dc.author.googleCho, J-
dc.author.googleSchubert, EF-
dc.author.googleSon, JK-
dc.author.googleKim, DY-
dc.author.googleKim, JK-
dc.relation.volume10-
dc.relation.issue6-
dc.relation.startpage1155-
dc.relation.lastpage1157-
dc.contributor.id10100864-
dc.relation.journalELECTRONIC MATERIALS LETTERS-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCIE-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationELECTRONIC MATERIALS LETTERS, v.10, no.6, pp.1155 - 1157-
dc.identifier.wosid000344632600023-
dc.date.tcdate2019-01-01-
dc.citation.endPage1157-
dc.citation.number6-
dc.citation.startPage1155-
dc.citation.titleELECTRONIC MATERIALS LETTERS-
dc.citation.volume10-
dc.contributor.affiliatedAuthorKim, JK-
dc.identifier.scopusid2-s2.0-84911460970-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc1-
dc.description.scptc2*
dc.date.scptcdate2018-05-121*
dc.type.docTypeArticle-
dc.subject.keywordAuthorlight-emitting diode-
dc.subject.keywordAuthorbreakdown voltage-
dc.subject.keywordAuthorcapacitance-
dc.subject.keywordAuthorGaN-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.description.journalRegisteredClasskci-
dc.relation.journalResearchAreaMaterials Science-

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김종규KIM, JONG KYU
Dept of Materials Science & Enginrg
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