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Cited 34 time in webofscience Cited 37 time in scopus
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dc.contributor.authorChoi, DC-
dc.contributor.authorJeon, YJ-
dc.contributor.authorLee, SJ-
dc.contributor.authorYun, JP-
dc.contributor.authorKim, SW-
dc.date.accessioned2016-03-31T07:47:57Z-
dc.date.available2016-03-31T07:47:57Z-
dc.date.created2015-02-04-
dc.date.issued2014-08-01-
dc.identifier.issn1559-128X-
dc.identifier.other2014-OAK-0000031278-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/14024-
dc.description.abstractPresently, product inspection based on vision systems is an important part of the steel-manufacturing industry. In this work, we focus on the detection of seam cracks in the edge region of steel plates. Seam cracks are generated in the vertical direction, and their width range is 0.2-0.6 mm. Moreover, the gray values of seam cracks are only 20-30 gray levels lower than those of the neighboring surface. Owing to these characteristics, we propose a new algorithm for detecting seam cracks using a Gabor filter combination method. To enhance the performance, we extracted features of seam cracks and employed a support vector machine classifier. The experimental results show that the proposed algorithm is suitable for detecting seam cracks. (C) 2014 Optical Society of America-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherOPTICAL SOC AMER-
dc.relation.isPartOfAPPLIED OPTICS-
dc.subjectDYNAMIC ENCODING ALGORITHM-
dc.subjectDEFECT DETECTION-
dc.subjectAUTOMATIC DETECTION-
dc.subjectREAL-
dc.subjectSEARCHES-
dc.subjectSYSTEM-
dc.titleAlgorithm for detecting seam cracks in steel plates using a Gabor filter combination method-
dc.typeArticle-
dc.contributor.college전자전기공학과-
dc.identifier.doi10.1364/AO.53.004865-
dc.author.googleChoi, DC-
dc.author.googleJeon, YJ-
dc.author.googleLee, SJ-
dc.author.googleYun, JP-
dc.author.googleKim, SW-
dc.relation.volume53-
dc.relation.issue22-
dc.relation.startpage4865-
dc.relation.lastpage4872-
dc.contributor.id10055882-
dc.relation.journalAPPLIED OPTICS-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationAPPLIED OPTICS, v.53, no.22, pp.4865 - 4872-
dc.identifier.wosid000340824800020-
dc.date.tcdate2019-01-01-
dc.citation.endPage4872-
dc.citation.number22-
dc.citation.startPage4865-
dc.citation.titleAPPLIED OPTICS-
dc.citation.volume53-
dc.contributor.affiliatedAuthorKim, SW-
dc.identifier.scopusid2-s2.0-84942366048-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc9-
dc.description.scptc6*
dc.date.scptcdate2018-05-121*
dc.type.docTypeArticle-
dc.subject.keywordPlusDYNAMIC ENCODING ALGORITHM-
dc.subject.keywordPlusDEFECT DETECTION-
dc.subject.keywordPlusAUTOMATIC DETECTION-
dc.subject.keywordPlusREAL-
dc.relation.journalWebOfScienceCategoryOptics-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaOptics-

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김상우KIM, SANG WOO
Dept of Electrical Enginrg
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