SkSP-V SAMPLING PLAN WITH GROUP SAMPLING PLAN AS REFERENCE BASED ON TRUNCATED LIFE TEST UNDER WEIBULL AND GENERALIZED EXPONENTIAL DISTRIBUTIONS

Abstract

This paper proposes SkSP-V acceptance sampling plans having group sampling plan based on the time truncated life test as the reference plan. The plan is designed for the mean life when the lifetime of the submitted product follows the Weibull distribution or the generalized exponential distribution. The two points on the operating characteristics curve is used to find the plan parameters satisfying the consumer's and the producer's risks while minimizing the average sample number. Also, the advantage of the proposed plan over the single group sampling plan is discussed. The extensive tables are provided and examples are given to adopt the plan in practice. © 2013 Pakistan Journal of Statistics.