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Distribution of nickel in zinc oxide nanowalls on sapphire substrate investigated using atom probe tomography SCIE SCOPUS

Title
Distribution of nickel in zinc oxide nanowalls on sapphire substrate investigated using atom probe tomography
Authors
SungMin ParkWooYoung JungPark, C
Date Issued
2013-06
Publisher
Scripta Materialia
Abstract
ZnO nanowall was synthesized using Ni catalyst and studied by atom probe tomography. Two regions of interest, one without and one with NiO, in ZnO nanowall were prepared. Ni simultaneously diffused with Zn during the formation of interlayer in the reaction between sapphire and ZnO. Atom probe tomography revealed Ni contents of about 1.09 and 1.33 at.% in the interlayers without and with NiO, respectively. The spinel structure of the ZnAl2O4 interlayer provides numerous octahedral sites into which Ni was doped. (C) 2013 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
Keywords
Atom probe tomography; TEM; Nanowall; Nickel; ZNAL2O4 NANOSTRUCTURES; OPTICAL-PROPERTIES; NANOWIRE ARRAYS; ZNO NANOWALLS; GROWTH; FABRICATION
URI
https://oasis.postech.ac.kr/handle/2014.oak/14987
DOI
10.1016/J.SCRIPTAMAT.2013.02.061
ISSN
1359-6462
Article Type
Article
Citation
Scripta Materialia, vol. 68, no. 12, page. 1000 - 1003, 2013-06
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박찬경PARK, CHAN GYUNG
Dept of Materials Science & Enginrg
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