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Aberration compensation for objective phase curvature in phase holographic microscopy SCIE SCOPUS

Title
Aberration compensation for objective phase curvature in phase holographic microscopy
Authors
Kyeong Won SeoYong Seok ChoiEun Seok SeoLee, SJ
Date Issued
2012-12-01
Publisher
OPTICAL SOC AMER
Abstract
In this study, we proposed a simple and fast numerical approach to compensate for aberrations induced by objective phase curvature. This method is based on the extraction of virtual background phase from reconstructed phase values using a line profile, followed by subtraction of the virtual background phase from the reconstructed phase image. The performance and feasibility of the method were demonstrated by applying it to the phase imaging of polystyrene microspheres and red blood cells. (C) 2012 Optical Society of America
Keywords
CONTRAST MICROSCOPY; DIGITAL HOLOGRAPHY
URI
https://oasis.postech.ac.kr/handle/2014.oak/15663
DOI
10.1364/OL.37.004976
ISSN
0146-9592
Article Type
Article
Citation
Optics Letters, vol. 37, no. 23, page. 4976 - 4978, 2012-12-01
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이상준LEE, SANG JOON
Dept of Mechanical Enginrg
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