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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Oh, JE | - |
| dc.contributor.author | Cho, YW | - |
| dc.contributor.author | Scarcelli, G | - |
| dc.contributor.author | Kim, YH | - |
| dc.date.accessioned | 2016-03-31T08:39:08Z | - |
| dc.date.available | 2016-03-31T08:39:08Z | - |
| dc.date.created | 2013-03-22 | - |
| dc.date.issued | 2013-03-01 | - |
| dc.identifier.issn | 0146-9592 | - |
| dc.identifier.other | 2013-OAK-0000027153 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/15745 | - |
| dc.description.abstract | We demonstrate sub-Rayleigh limit imaging of an object via speckle illumination. Imaging beyond the conventional Rayleigh limit is achieved by illuminating the object with pseudothermal light that exhibits a random speckle pattern. An object image is reconstructed from the second-order correlation measurement and the resolution of the image, which exceeds the Rayleigh limit, is shown to be related to the size of the speckle pattern that is tied to the lateral coherence length of the pseudothermal light. (c) 2013 Optical Society of America | - |
| dc.description.statementofresponsibility | X | - |
| dc.language | English | - |
| dc.publisher | Optical Society of America | - |
| dc.relation.isPartOf | OPTICS LETTERS | - |
| dc.subject | DIFFRACTION-LIMIT | - |
| dc.subject | RESOLUTION LIMIT | - |
| dc.subject | MICROSCOPY | - |
| dc.subject | LIGHT | - |
| dc.title | Sub-Rayleigh imaging via speckle illumination | - |
| dc.type | Article | - |
| dc.contributor.college | 물리학과 | - |
| dc.identifier.doi | 10.1364/OL.38.000682 | - |
| dc.author.google | Oh J.-E., Cho Y.-W., Scarcelli G., Kim Y.-H. | - |
| dc.relation.volume | 38 | - |
| dc.relation.issue | 5 | - |
| dc.relation.startpage | 682 | - |
| dc.relation.lastpage | 684 | - |
| dc.contributor.id | 10103975 | - |
| dc.relation.journal | OPTICS LETTERS | - |
| dc.relation.index | SCI급, SCOPUS 등재논문 | - |
| dc.relation.sci | SCI | - |
| dc.collections.name | Journal Papers | - |
| dc.type.rims | ART | - |
| dc.identifier.bibliographicCitation | OPTICS LETTERS, v.38, no.5, pp.682 - 684 | - |
| dc.identifier.wosid | 000315602600029 | - |
| dc.date.tcdate | 2019-01-01 | - |
| dc.citation.endPage | 684 | - |
| dc.citation.number | 5 | - |
| dc.citation.startPage | 682 | - |
| dc.citation.title | OPTICS LETTERS | - |
| dc.citation.volume | 38 | - |
| dc.contributor.affiliatedAuthor | Kim, YH | - |
| dc.identifier.scopusid | 2-s2.0-84874512424 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
| dc.description.wostc | 35 | - |
| dc.description.scptc | 31 | * |
| dc.date.scptcdate | 2018-05-121 | * |
| dc.type.docType | Article | - |
| dc.subject.keywordPlus | DIFFRACTION-LIMIT | - |
| dc.subject.keywordPlus | RESOLUTION LIMIT | - |
| dc.subject.keywordPlus | MICROSCOPY | - |
| dc.subject.keywordPlus | LIGHT | - |
| dc.relation.journalWebOfScienceCategory | Optics | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Optics | - |
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Related Researcher
- 김윤호Kim, Yoon-Ho
- Dept of Physics