Method for measuring nanoscale local strain in a dual phase steel using digital image correlation with nanodot patterns
SCIE
SCOPUS
- Title
- Method for measuring nanoscale local strain in a dual phase steel using digital image correlation with nanodot patterns
- Authors
- Joo, SH; Lee, JK; Koo, JM; Lee, S; Suh, DW; Kim, HS
- Date Issued
- 2013-03
- Publisher
- Elsevier
- Abstract
- Local strain analyses in a dual phase steel were performed using a digital image correlation (DIC) method in association with Ag nanodot patterning. The optimum size of the nanodots for DIC was estimated from image error analyses. The nanodot patterning sheds light on the DIC for nanoscale local strain analysis due to its many advantages, such as high productivity, large patterning area, easy control of the dot size, and, furthermore, good adhesion. (c) 2012 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
- Keywords
- Image analysis; Dual phases; Nanostructure; Local strain measurement; DEFORMATION; TENSION
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/15817
- DOI
- 10.1016/J.SCRIPTAMAT.2012.10.025
- ISSN
- 1359-6462
- Article Type
- Article
- Citation
- SCRIPTA MATERIALIA, vol. 68, no. 5, page. 245 - 248, 2013-03
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