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Cited 7 time in webofscience Cited 9 time in scopus
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dc.contributor.authorPark, B-
dc.contributor.authorKim, J-
dc.contributor.authorCho, M-
dc.contributor.authorNamkung, W-
dc.contributor.authorKim, SJ-
dc.contributor.authorYoo, HY-
dc.date.accessioned2016-03-31T08:59:43Z-
dc.date.available2016-03-31T08:59:43Z-
dc.date.created2012-06-26-
dc.date.issued2012-06-
dc.identifier.issn0093-3813-
dc.identifier.other2012-OAK-0000025610-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/16442-
dc.description.abstract5 Plasma-based ion implantation (PBII) is the well-established technique for material surface modification. In this paper, we described the ballistic-mode PBII process in which repetitive high-voltage pulses are applied to the grid a few centimeters from a polyimide (PI) film target. The high-voltage pulse applied to the grid has the peak values of -30 kV, width of 2.5 mu s, rise time of 1.5 mu s, and fall time of 0.5 or 40 mu s. In this process, ions propagate ballistically from a grid to the PI film and modify the surface resistivity of the PI film. The efficiency of surface-resistivity modification depends on the fall time of the pulse applied to the grid. The ballistic-mode PBII process affects the surface characteristics of PI to a depth of similar to 90 nm.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherIEEE-
dc.relation.isPartOfIEEE TRANSACTIONS ON PLASMA SCIENCE-
dc.subjectInsulator surface modification-
dc.subjection implantation-
dc.subjectpulse modulator-
dc.subjectsurface resistivity-
dc.subjectDISSIPATION-
dc.subjectTECHNOLOGY-
dc.titleBallistic-mode plasma-based ion implantation for surface-resistivity modification of polyimide film-
dc.typeArticle-
dc.contributor.college첨단원자력공학부-
dc.identifier.doi10.1109/TPS.2012.219-
dc.author.googlePark B., Kim J., Cho M., Namkung W., Kim S.J., Yoo H.Y.-
dc.relation.volume40-
dc.relation.issue6-
dc.relation.startpage1749-
dc.relation.lastpage1752-
dc.contributor.id10151947-
dc.relation.journalIEEE TRANSACTIONS ON PLASMA SCIENCE-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationIEEE TRANSACTIONS ON PLASMA SCIENCE, v.40, no.6, pp.1749 - 1752-
dc.identifier.wosid000305156200018-
dc.date.tcdate2019-01-01-
dc.citation.endPage1752-
dc.citation.number6-
dc.citation.startPage1749-
dc.citation.titleIEEE TRANSACTIONS ON PLASMA SCIENCE-
dc.citation.volume40-
dc.contributor.affiliatedAuthorCho, M-
dc.identifier.scopusid2-s2.0-84862300355-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc5-
dc.type.docTypeArticle-
dc.subject.keywordAuthorInsulator surface modification-
dc.subject.keywordAuthorion implantation-
dc.subject.keywordAuthorpulse modulator-
dc.subject.keywordAuthorsurface resistivity-
dc.relation.journalWebOfScienceCategoryPhysics, Fluids & Plasmas-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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조무현CHO, MOO HYUN
Div. of Advanced Nuclear Enginrg
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