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Cited 33 time in webofscience Cited 34 time in scopus
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dc.contributor.authorBalamurali, S-
dc.contributor.authorJun, CH-
dc.date.accessioned2016-03-31T09:11:06Z-
dc.date.available2016-03-31T09:11:06Z-
dc.date.created2012-03-11-
dc.date.issued2009-10-
dc.identifier.issn0266-4763-
dc.identifier.other2009-OAK-0000024877-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/16781-
dc.description.abstractThis article proposes a variables two-plan sampling system called tightened-normal-tightened (TNT) sampling inspection scheme where the quality characteristic follows a normal distribution or a lognormal distribution and has an upper or a lower specification limit. The TNT variables sampling inspection scheme will be useful when testing is costly and destructive. The advantages of the variables TNT scheme over variables single and double sampling plans and attributes TNT scheme are discussed. Tables are also constructed for the selection of parameters of known and unknown standard deviation variables TNT schemes for a given acceptable quality level (AQL) and limiting quality level (LQL). The problem is formulated as a nonlinear programming where the objective function to be minimized is the average sample number and the constraints are related to lot acceptance probabilities at AQL and LQL under the operating characteristic curve.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherROUTLEDGE JOURNALS, TAYLOR & FRANCIS LTD-
dc.relation.isPartOfJOURNAL OF APPLIED STATISTICS-
dc.subjectaverage sample number-
dc.subjectOC curve-
dc.subjectsampling system-
dc.subjecttwo-plan system-
dc.subjectINSPECTION-
dc.subjectCONSTRUCTION-
dc.subjectATTRIBUTES-
dc.subjectSELECTION-
dc.subjectPLANS-
dc.titleDesigning of a variables two-plan system by minimizing the average sample number-
dc.typeArticle-
dc.contributor.college산업경영공학과-
dc.identifier.doi10.1080/02664760802562514-
dc.author.googleBalamurali, S-
dc.author.googleJun, CH-
dc.relation.volume36-
dc.relation.issue10-
dc.relation.startpage1159-
dc.relation.lastpage1172-
dc.contributor.id10070938-
dc.relation.journalJOURNAL OF APPLIED STATISTICS-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCIE-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationJOURNAL OF APPLIED STATISTICS, v.36, no.10, pp.1159 - 1172-
dc.identifier.wosid000270156000009-
dc.date.tcdate2019-01-01-
dc.citation.endPage1172-
dc.citation.number10-
dc.citation.startPage1159-
dc.citation.titleJOURNAL OF APPLIED STATISTICS-
dc.citation.volume36-
dc.contributor.affiliatedAuthorJun, CH-
dc.identifier.scopusid2-s2.0-70350180450-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc21-
dc.description.scptc18*
dc.date.scptcdate2018-05-121*
dc.type.docTypeArticle-
dc.subject.keywordPlusINSPECTION-
dc.subject.keywordPlusCONSTRUCTION-
dc.subject.keywordPlusATTRIBUTES-
dc.subject.keywordPlusSELECTION-
dc.subject.keywordPlusPLANS-
dc.subject.keywordAuthoraverage sample number-
dc.subject.keywordAuthorOC curve-
dc.subject.keywordAuthorsampling system-
dc.subject.keywordAuthortwo-plan system-
dc.relation.journalWebOfScienceCategoryStatistics & Probability-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMathematics-

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전치혁JUN, CHI HYUCK
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