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Cited 16 time in webofscience Cited 16 time in scopus
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dc.contributor.authorKim, B-
dc.contributor.authorVladimir Stojanovic-
dc.date.accessioned2016-03-31T09:17:10Z-
dc.date.available2016-03-31T09:17:10Z-
dc.date.created2012-01-26-
dc.date.issued2008-09-
dc.identifier.issn0740-7475-
dc.identifier.other2008-OAK-0000024575-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/16949-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherIEEE-
dc.relation.isPartOfIEEE DESIGN & TEST OF COMPUTERS-
dc.titleCharacterization of Equalized and Repeated Interconnects for NoC Applications-
dc.typeArticle-
dc.contributor.college전자전기공학과-
dc.identifier.doi10.1109/MDT.2008.137-
dc.author.googleKim, B-
dc.author.googleStojanovic, V-
dc.relation.volume25-
dc.relation.issue5-
dc.relation.startpage430-
dc.relation.lastpage439-
dc.contributor.id11082511-
dc.relation.journalIEEE DESIGN & TEST OF COMPUTERS-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationIEEE DESIGN & TEST OF COMPUTERS, v.25, no.5, pp.430 - 439-
dc.identifier.wosid000259673900005-
dc.date.tcdate2019-01-01-
dc.citation.endPage439-
dc.citation.number5-
dc.citation.startPage430-
dc.citation.titleIEEE DESIGN & TEST OF COMPUTERS-
dc.citation.volume25-
dc.contributor.affiliatedAuthorKim, B-
dc.identifier.scopusid2-s2.0-55349118838-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc13-
dc.description.scptc13*
dc.date.scptcdate2018-05-121*
dc.type.docTypeArticle-
dc.relation.journalWebOfScienceCategoryComputer Science, Hardware & Architecture-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaComputer Science-
dc.relation.journalResearchAreaEngineering-

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김병섭KIM, BYUNGSUB
Dept of Electrical Enginrg
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