DC Field | Value | Language |
---|---|---|
dc.contributor.author | Liu, W | - |
dc.contributor.author | Liou, JJ | - |
dc.contributor.author | Kuribara, K | - |
dc.contributor.author | Fukuda, K | - |
dc.contributor.author | Sekitani, T | - |
dc.contributor.author | Someya, T | - |
dc.contributor.author | Chung, J | - |
dc.contributor.author | Jeong, YH | - |
dc.contributor.author | Wang, ZX | - |
dc.contributor.author | Lin, CL | - |
dc.date.accessioned | 2016-03-31T09:28:27Z | - |
dc.date.available | 2016-03-31T09:28:27Z | - |
dc.date.created | 2011-08-11 | - |
dc.date.issued | 2011-07 | - |
dc.identifier.issn | 0741-3106 | - |
dc.identifier.other | 2011-OAK-0000023982 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/17233 | - |
dc.description.abstract | Low-voltage pentacene-based organic thin-film transistors (OTFTs) are characterized for the first time under the electrostatic discharge (ESD) stresses. The measurements are conducted using the transmission line pulsing (TLP) tester which generates the human body model equivalent pulses. The ESD behaviors and tolerances of OTFTs having different dimensions and gate biasing conditions are investigated. OTFT's failure mechanism and dc performance degradation due to the ESD stresses are also studied. | - |
dc.description.statementofresponsibility | X | - |
dc.language | English | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.relation.isPartOf | IEEE ELECTRON DEVICE LETTERS | - |
dc.subject | Degradation | - |
dc.subject | electrostatic discharge (ESD) | - |
dc.subject | organic thin-film transistor (OTFT) | - |
dc.title | Study of Organic Thin-Film Transistors Under Electrostatic Discharge Stresses | - |
dc.type | Article | - |
dc.contributor.college | 정보전자융합공학부 | - |
dc.identifier.doi | 10.1109/LED.2011.2142411 | - |
dc.author.google | Liu, W | - |
dc.author.google | Liou, JJ | - |
dc.author.google | Kuribara, K | - |
dc.author.google | Fukuda, K | - |
dc.author.google | Sekitani, T | - |
dc.author.google | Someya, T | - |
dc.author.google | Chung, J | - |
dc.author.google | Jeong, YH | - |
dc.author.google | Wang, ZX | - |
dc.author.google | Lin, CL | - |
dc.relation.volume | 32 | - |
dc.relation.issue | 7 | - |
dc.relation.startpage | 967 | - |
dc.relation.lastpage | 969 | - |
dc.contributor.id | 10106021 | - |
dc.relation.journal | IEEE ELECTRON DEVICE LETTERS | - |
dc.relation.index | SCI급, SCOPUS 등재논문 | - |
dc.relation.sci | SCI | - |
dc.collections.name | Journal Papers | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | IEEE ELECTRON DEVICE LETTERS, v.32, no.7, pp.967 - 969 | - |
dc.identifier.wosid | 000292165200045 | - |
dc.date.tcdate | 2019-01-01 | - |
dc.citation.endPage | 969 | - |
dc.citation.number | 7 | - |
dc.citation.startPage | 967 | - |
dc.citation.title | IEEE ELECTRON DEVICE LETTERS | - |
dc.citation.volume | 32 | - |
dc.contributor.affiliatedAuthor | Jeong, YH | - |
dc.identifier.scopusid | 2-s2.0-79959795013 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 4 | - |
dc.description.scptc | 6 | * |
dc.date.scptcdate | 2018-05-121 | * |
dc.type.docType | Article | - |
dc.subject.keywordAuthor | Degradation | - |
dc.subject.keywordAuthor | electrostatic discharge (ESD) | - |
dc.subject.keywordAuthor | organic thin-film transistor (OTFT) | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
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