DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lim, H | - |
dc.contributor.author | Kim, D | - |
dc.date.accessioned | 2016-03-31T12:20:14Z | - |
dc.date.available | 2016-03-31T12:20:14Z | - |
dc.date.created | 2009-03-16 | - |
dc.date.issued | 2004-09 | - |
dc.identifier.issn | 0947-8396 | - |
dc.identifier.other | 2004-OAK-0000004420 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/17803 | - |
dc.description.abstract | The dynamics of laser-induced plasma/shockwave and the interaction with a surface in the laser shock cleaning process are analyzed by optical diagnostics. Shockwaves are generated by a Q-switched Nd:YAG laser in air or with N-2, Ar, and He injection into the focal spot. The shock velocity is measured by monitoring the photoacoustic probe-beam deflection signal under different conditions. In addition, nanosecond time-resolved images of shockwave propagation and interaction with the substrate are obtained by the laser-flash shadowgraphy. The results reveal the effect of various operation parameters of the laser shock cleaning process on shockwave intensity, energy-conversion efficiency, and flow characteristics. Discussions are made on the cleaning mechanisms based on the experimental observations. | - |
dc.description.statementofresponsibility | X | - |
dc.language | English | - |
dc.publisher | SPRINGER | - |
dc.relation.isPartOf | APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | - |
dc.subject | FINE PARTICLES | - |
dc.subject | SURFACES | - |
dc.subject | ENTRAINMENT | - |
dc.subject | REMOVAL | - |
dc.subject | WAVES | - |
dc.subject | GENERATION | - |
dc.title | Optical diagnostics for particle-cleaning process utilizing laser-induced shockwave | - |
dc.type | Article | - |
dc.contributor.college | 기계공학과 | - |
dc.identifier.doi | 10.1007/s00339-004-2584-3 | - |
dc.author.google | Lim, H | - |
dc.author.google | Kim, D | - |
dc.relation.volume | 79 | - |
dc.relation.issue | 4-6 | - |
dc.relation.startpage | 965 | - |
dc.relation.lastpage | 968 | - |
dc.contributor.id | 10103614 | - |
dc.relation.journal | APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | - |
dc.relation.index | SCI급, SCOPUS 등재논문 | - |
dc.relation.sci | SCI | - |
dc.collections.name | Journal Papers | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, v.79, no.4-6, pp.965 - 968 | - |
dc.identifier.wosid | 000222766100060 | - |
dc.date.tcdate | 2019-01-01 | - |
dc.citation.endPage | 968 | - |
dc.citation.number | 4-6 | - |
dc.citation.startPage | 965 | - |
dc.citation.title | APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | - |
dc.citation.volume | 79 | - |
dc.contributor.affiliatedAuthor | Kim, D | - |
dc.identifier.scopusid | 2-s2.0-4344635475 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 14 | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | FINE PARTICLES | - |
dc.subject.keywordPlus | SURFACES | - |
dc.subject.keywordPlus | ENTRAINMENT | - |
dc.subject.keywordPlus | REMOVAL | - |
dc.subject.keywordPlus | WAVES | - |
dc.subject.keywordPlus | GENERATION | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
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