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dc.contributor.authorOh, TK-
dc.contributor.authorBaek, CH-
dc.contributor.authorKang, BK-
dc.date.accessioned2016-03-31T12:21:48Z-
dc.date.available2016-03-31T12:21:48Z-
dc.date.created2009-02-28-
dc.date.issued2004-09-
dc.identifier.issn0038-1101-
dc.identifier.other2004-OAK-0000004392-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/17831-
dc.description.abstractThis paper presents a method of surface treatment for improving the current gain of an AlGaAs/GaAs heterojunction bipolar transistor (HBT). Several recipes for GaAs surface treatment, including each and several combinations of the H, plasma, NH3 plasma, and (NH4)(2)S-x chemical treatments are examined. The lowest SiO2/GaAs interface state density of 1.23 x 10(10) cm(-2) eV(-1) is obtained when the GaAs surface is treated in sequence with (NH4)(2)S-x:H2O = 1:1 solution, H-2 plasma, and NH3 plasma. The current gain of an AlGaAs/GaAs HBT, whose extrinsic base surface is treated with this recipe, is enhanced at a low collector current by a factor of 2.5 from that without surface treatment. The maximum current gain is also enhanced by a factor of 1.37. (C) 2004 Elsevier Ltd. All rights reserved.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD-
dc.relation.isPartOfSOLID-STATE ELECTRONICS-
dc.subjectsurface passivation-
dc.subjectsurface treatment-
dc.subjectheterojunction bipolar transistor-
dc.subjectmetal insulator capacitor-
dc.subjectX-ray photoelectron spectroscopy-
dc.subjectPLASMA PASSIVATION-
dc.subjectHYDROGEN-
dc.titleSurface treatment for enhancing current gain of AlGaAs/GaAs heterojunction bipolar transistor-
dc.typeArticle-
dc.contributor.college전자전기공학과-
dc.identifier.doi10.1016/J.SSE.2004.0-
dc.author.googleOh, TK-
dc.author.googleBaek, CH-
dc.author.googleKang, BK-
dc.relation.volume48-
dc.relation.issue9-
dc.relation.startpage1549-
dc.relation.lastpage1553-
dc.contributor.id10071834-
dc.relation.journalSOLID-STATE ELECTRONICS-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationSOLID-STATE ELECTRONICS, v.48, no.9, pp.1549 - 1553-
dc.identifier.wosid000222563100013-
dc.date.tcdate2019-01-01-
dc.citation.endPage1553-
dc.citation.number9-
dc.citation.startPage1549-
dc.citation.titleSOLID-STATE ELECTRONICS-
dc.citation.volume48-
dc.contributor.affiliatedAuthorKang, BK-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc13-
dc.type.docTypeArticle-
dc.subject.keywordAuthorsurface passivation-
dc.subject.keywordAuthorsurface treatment-
dc.subject.keywordAuthorheterojunction bipolar transistor-
dc.subject.keywordAuthormetal insulator capacitor-
dc.subject.keywordAuthorX-ray photoelectron spectroscopy-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaPhysics-

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강봉구KANG, BONG KOO
Dept of Electrical Enginrg
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