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Cited 16 time in webofscience Cited 18 time in scopus
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dc.contributor.authorWoo, DH-
dc.contributor.authorYoo, JS-
dc.contributor.authorPark, SM-
dc.contributor.authorJeon, IC-
dc.contributor.authorKang, H-
dc.date.accessioned2016-03-31T12:27:19Z-
dc.date.available2016-03-31T12:27:19Z-
dc.date.created2009-03-16-
dc.date.issued2004-04-20-
dc.identifier.issn0253-2964-
dc.identifier.other2004-OAK-0000004260-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/17929-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherKOREAN CHEMICAL SOC-
dc.relation.isPartOfBULLETIN OF THE KOREAN CHEMICAL SOCIETY-
dc.subjectelectrochemical interface-
dc.subjectelectrical double layer-
dc.subjectelectrode potential-
dc.subjectscanning tunneling microscopy-
dc.subjectdiffuse double layer-
dc.subjectATOMIC-FORCE MICROSCOPE-
dc.subjectDOUBLE-LAYER FORCES-
dc.subjectMICA SURFACES-
dc.subjectELECTRODE/ELECTROLYTE INTERFACE-
dc.subjectDEPENDENT INTERACTIONS-
dc.subjectELECTROLYTE-SOLUTIONS-
dc.subjectELECTRIC-FIELDS-
dc.titleDirect probing into the electrochemical interface using a novel potential probe: Au(111) electrode/NaBF4 solution interface-
dc.typeArticle-
dc.contributor.college화학과-
dc.identifier.doi10.5012/bkcs.2004.25.4.577-
dc.author.googleWoo, DH-
dc.author.googleYoo, JS-
dc.author.googlePark, SM-
dc.author.googleJeon, IC-
dc.author.googleKang, H-
dc.relation.volume25-
dc.relation.issue4-
dc.relation.startpage577-
dc.relation.lastpage580-
dc.contributor.id10200281-
dc.relation.journalBULLETIN OF THE KOREAN CHEMICAL SOCIETY-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationBULLETIN OF THE KOREAN CHEMICAL SOCIETY, v.25, no.4, pp.577 - 580-
dc.identifier.wosid000221464500030-
dc.date.tcdate2019-01-01-
dc.citation.endPage580-
dc.citation.number4-
dc.citation.startPage577-
dc.citation.titleBULLETIN OF THE KOREAN CHEMICAL SOCIETY-
dc.citation.volume25-
dc.contributor.affiliatedAuthorPark, SM-
dc.identifier.scopusid2-s2.0-2542489535-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc14-
dc.type.docTypeArticle-
dc.subject.keywordPlusATOMIC-FORCE MICROSCOPE-
dc.subject.keywordPlusDOUBLE-LAYER FORCES-
dc.subject.keywordPlusMICA SURFACES-
dc.subject.keywordPlusELECTRODE/ELECTROLYTE INTERFACE-
dc.subject.keywordPlusDEPENDENT INTERACTIONS-
dc.subject.keywordPlusELECTROLYTE-SOLUTIONS-
dc.subject.keywordPlusELECTRIC-FIELDS-
dc.subject.keywordAuthorelectrochemical interface-
dc.subject.keywordAuthorelectrical double layer-
dc.subject.keywordAuthorelectrode potential-
dc.subject.keywordAuthorscanning tunneling microscopy-
dc.subject.keywordAuthordiffuse double layer-
dc.relation.journalWebOfScienceCategoryChemistry, Multidisciplinary-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.description.journalRegisteredClasskci-
dc.relation.journalResearchAreaChemistry-

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