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Cited 19 time in webofscience Cited 19 time in scopus
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dc.contributor.authorJang, HW-
dc.contributor.authorKim, JK-
dc.contributor.authorLee, JL-
dc.contributor.authorSchroeder, J-
dc.contributor.authorS-
dc.contributor.authors, T-
dc.date.accessioned2016-03-31T12:55:57Z-
dc.date.available2016-03-31T12:55:57Z-
dc.date.created2009-02-28-
dc.date.issued2003-01-27-
dc.identifier.issn0003-6951-
dc.identifier.other2003-OAK-0000003146-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/18727-
dc.description.abstractThe electrical properties of metal contacts on laser-irradiated n-type GaN were investigated using synchrotron radiation photoemission spectroscopy. A KrF excimer laser pulse of 600 mJ/cm(2) onto GaN led to a decrease in the Ni Schottky barrier height from 0.91 to 0.47 eV, resulting in the formation of a nonalloyed Ohmic contact with a specific contact resistivity of 1.7x10(-6) Omega cm(2). Metallic Ga decomposed from GaN by laser irradiation was transformed into GaOx, playing a role in promoting outdiffusion of N atoms. A large number of N vacancies were produced, forming a degenerated GaN layer near the surface, resulting in the good Ohmic contact. (C) 2003 American Institute of Physics.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.relation.isPartOfAPPLIED PHYSICS LETTERS-
dc.titleElectrical properties of metal contacts on laser-irradiated n-type GaN-
dc.typeArticle-
dc.contributor.college신소재공학과-
dc.identifier.doi10.1063/1.1537515-
dc.author.googleJang, HW-
dc.author.googleKim, JK-
dc.author.googleLee, JL-
dc.author.googleSchroeder, J-
dc.author.googleSands, T-
dc.relation.volume82-
dc.relation.issue4-
dc.relation.startpage580-
dc.relation.lastpage582-
dc.contributor.id10105416-
dc.relation.journalAPPLIED PHYSICS LETTERS-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationAPPLIED PHYSICS LETTERS, v.82, no.4, pp.580 - 582-
dc.identifier.wosid000180564000032-
dc.date.tcdate2019-01-01-
dc.citation.endPage582-
dc.citation.number4-
dc.citation.startPage580-
dc.citation.titleAPPLIED PHYSICS LETTERS-
dc.citation.volume82-
dc.contributor.affiliatedAuthorKim, JK-
dc.contributor.affiliatedAuthorLee, JL-
dc.identifier.scopusid2-s2.0-0037467964-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc18-
dc.description.scptc18*
dc.date.scptcdate2018-05-121*
dc.type.docTypeArticle-
dc.subject.keywordPlusP-TYPE GAN-
dc.subject.keywordPlusLIFT-OFF-
dc.subject.keywordPlusOHMIC CONTACT-
dc.subject.keywordPlusFILMS-
dc.subject.keywordPlusDAMAGE-
dc.subject.keywordPlusDIODES-
dc.subject.keywordPlusMG-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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이종람LEE, JONG LAM
Dept of Materials Science & Enginrg
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