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dc.contributor.authorJeong, MY-
dc.contributor.authorLee, BH-
dc.contributor.authorJeong, YH-
dc.date.accessioned2016-03-31T13:15:31Z-
dc.date.available2016-03-31T13:15:31Z-
dc.date.created2009-08-05-
dc.date.issued2001-03-
dc.identifier.issn0021-4922-
dc.identifier.other2001-OAK-0000002161-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/19423-
dc.description.abstractWe have investigated design considerations for low-power single-electron transistor (SET) logic circuits. Supply-voltage scaling is introduced as a method for reducing the power consumption of SET circuits. A detailed analysis of the effects of supply-voltage scaling is given on the basis of the behavior of a complementary capacitively coupled SET inverter circuit. It has been shown that the hysteresis caused by the supply-voltage-dependent threshold voltage of a SET quickly disappears as the temperature rises, and does not ruin the desired inverting operation at a practical operation temperature. Also shown is the considerable impact of the supply-voltage scaling on reducing the power expended by leakage and short-circuit. From the results of power-delay product and delay time. it has been shown that the supply-voltage scaling should be carried out within 20% of maximum supply-voltage to maintain overall circuit performance.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherINST PURE APPLIED PHYSICS-
dc.relation.isPartOfJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS-
dc.subjectsingle-electron transistor-
dc.subjectsingle-electron transistor logic-
dc.subjectCoulomb blockade-
dc.subjectpower consumption-
dc.subjectGATE-
dc.titleDesign considerations for low-power single-electron transistor logic circuits-
dc.typeArticle-
dc.contributor.college전자전기공학과-
dc.identifier.doi10.1143/JJAP.40.2054-
dc.author.googleJeong, MY-
dc.author.googleLee, BH-
dc.author.googleJeong, YH-
dc.relation.volume40-
dc.relation.issue3B-
dc.relation.startpage2054-
dc.relation.lastpage2057-
dc.contributor.id10106021-
dc.relation.journalJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameConference Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.40, no.3B, pp.2054 - 2057-
dc.identifier.wosid000170771600130-
dc.date.tcdate2019-01-01-
dc.citation.endPage2057-
dc.citation.number3B-
dc.citation.startPage2054-
dc.citation.titleJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS-
dc.citation.volume40-
dc.contributor.affiliatedAuthorJeong, YH-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc6-
dc.type.docTypeArticle; Proceedings Paper-
dc.subject.keywordAuthorsingle-electron transistor-
dc.subject.keywordAuthorsingle-electron transistor logic-
dc.subject.keywordAuthorCoulomb blockade-
dc.subject.keywordAuthorpower consumption-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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정윤하JEONG, YOON HA
Dept of Electrical Enginrg
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