Zr/Ti ratio dependence of the deformation in the hysteresis loop of Pb(Zr,Ti)O-3 thin films
SCIE
SCOPUS
- Title
- Zr/Ti ratio dependence of the deformation in the hysteresis loop of Pb(Zr,Ti)O-3 thin films
- Authors
- Lee, EG; Lee, JK; Kim, JY; Lee, JG; Jang, HM; Kim, SJ
- Date Issued
- 1999-12
- Publisher
- KLUWER ACADEMIC PUBL
- Keywords
- FERROELECTRIC PROPERTIES; DEFECTS; STOICHIOMETRY; CAPACITORS; CERAMICS; FATIGUE; MODEL; SHIFT
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/20165
- DOI
- 10.1023/A:1006797421070
- ISSN
- 0261-8028
- Article Type
- Article
- Citation
- JOURNAL OF MATERIALS SCIENCE LETTERS, vol. 18, no. 24, page. 2025 - 2028, 1999-12
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- There are no files associated with this item.
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