DC Field | Value | Language |
---|---|---|
dc.contributor.author | Sohn, YS | - |
dc.contributor.author | Lee, JC | - |
dc.contributor.author | Park, HJ | - |
dc.contributor.author | Cho, SI | - |
dc.date.accessioned | 2016-03-31T13:41:15Z | - |
dc.date.available | 2016-03-31T13:41:15Z | - |
dc.date.created | 2009-02-28 | - |
dc.date.issued | 1999-05-27 | - |
dc.identifier.issn | 0013-5194 | - |
dc.identifier.other | 1999-OAK-0000000782 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/20381 | - |
dc.description.abstract | Empirical equations are presented for the self- and mutual capacitances and inductances of coupled microstrip lines with one side exposed to air. The derived equations have been applied to estimate crosstalk and to establish design guides for the spacing between coupled microstrip lines. The validity of this work was verified by comparison with measurements of electrical parameters and crosstalk. | - |
dc.description.statementofresponsibility | X | - |
dc.language | English | - |
dc.publisher | IEE-INST ELEC ENG | - |
dc.relation.isPartOf | ELECTRONICS LETTERS | - |
dc.subject | FORMULAS | - |
dc.title | Empirical equations for electrical parameters of coupled microstrip lines with one side exposed to air | - |
dc.type | Article | - |
dc.contributor.college | 전자전기공학과 | - |
dc.identifier.doi | 10.1049/el:19990599 | - |
dc.author.google | SOHN, YS | - |
dc.author.google | LEE, JC | - |
dc.author.google | PARK, HJ | - |
dc.author.google | CHO, SI | - |
dc.relation.volume | 35 | - |
dc.relation.issue | 11 | - |
dc.relation.startpage | 906 | - |
dc.relation.lastpage | 907 | - |
dc.contributor.id | 10071836 | - |
dc.relation.journal | ELECTRONICS LETTERS | - |
dc.relation.index | SCI급, SCOPUS 등재논문 | - |
dc.relation.sci | SCI | - |
dc.collections.name | Journal Papers | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | ELECTRONICS LETTERS, v.35, no.11, pp.906 - 907 | - |
dc.identifier.wosid | 000080971500038 | - |
dc.date.tcdate | 2019-01-01 | - |
dc.citation.endPage | 907 | - |
dc.citation.number | 11 | - |
dc.citation.startPage | 906 | - |
dc.citation.title | ELECTRONICS LETTERS | - |
dc.citation.volume | 35 | - |
dc.contributor.affiliatedAuthor | Park, HJ | - |
dc.identifier.scopusid | 2-s2.0-0032668816 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 5 | - |
dc.type.docType | Article | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
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