DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Y | - |
dc.contributor.author | Roh, TM | - |
dc.contributor.author | Kim, B | - |
dc.date.accessioned | 2016-03-31T13:44:13Z | - |
dc.date.available | 2016-03-31T13:44:13Z | - |
dc.date.created | 2009-03-18 | - |
dc.date.issued | 1999-03-05 | - |
dc.identifier.issn | 0895-2477 | - |
dc.identifier.other | 1999-OAK-0000000625 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/20489 | - |
dc.description.abstract | We propose a new method to find the higher order Taylor series coefficients of a MESFET channel current model for Volterra series analysis from the measured lower order Taylor coefficients at several bias points. Generally, the third-order Taylor expansion is not sufficient to accurately characterize the linear amplifier distortion properties. The channel current model is improved with these additional higher order terms. (C) 1999 John Wiley & Sons, Inc. | - |
dc.description.statementofresponsibility | X | - |
dc.language | English | - |
dc.publisher | JOHN WILEY & SONS INC | - |
dc.relation.isPartOf | MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | - |
dc.subject | MESFET | - |
dc.subject | nonlinear analysis | - |
dc.subject | channel current | - |
dc.subject | INTERMODULATION DISTORTION | - |
dc.subject | GAAS-MESFETS | - |
dc.subject | AMPLIFIERS | - |
dc.title | A novel higher order extending method in a MESFET channel current model for Volterra series analysis | - |
dc.type | Article | - |
dc.contributor.college | 전자전기공학과 | - |
dc.identifier.doi | 10.1002/(SICI)1098-2760(19990305)20:5<292::AID-MOP3>3.0.CO;2-W | - |
dc.author.google | Kim, Y | - |
dc.author.google | Roh, TM | - |
dc.author.google | Kim, B | - |
dc.relation.volume | 20 | - |
dc.relation.issue | 5 | - |
dc.relation.startpage | 292 | - |
dc.relation.lastpage | 295 | - |
dc.contributor.id | 10106173 | - |
dc.relation.journal | MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | - |
dc.relation.index | SCI급, SCOPUS 등재논문 | - |
dc.relation.sci | SCIE | - |
dc.collections.name | Journal Papers | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, v.20, no.5, pp.292 - 295 | - |
dc.identifier.wosid | 000078707200003 | - |
dc.date.tcdate | 2019-01-01 | - |
dc.citation.endPage | 295 | - |
dc.citation.number | 5 | - |
dc.citation.startPage | 292 | - |
dc.citation.title | MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | - |
dc.citation.volume | 20 | - |
dc.contributor.affiliatedAuthor | Kim, B | - |
dc.identifier.scopusid | 2-s2.0-0033525316 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 3 | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | INTERMODULATION DISTORTION | - |
dc.subject.keywordPlus | GAAS-MESFETS | - |
dc.subject.keywordPlus | AMPLIFIERS | - |
dc.subject.keywordAuthor | MESFET | - |
dc.subject.keywordAuthor | nonlinear analysis | - |
dc.subject.keywordAuthor | channel current | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Optics | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Optics | - |
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