DC Field | Value | Language |
---|---|---|
dc.contributor.author | Banerjee, S | - |
dc.contributor.author | Park, YJ | - |
dc.contributor.author | Lee, DR | - |
dc.contributor.author | Jeong, YH | - |
dc.contributor.author | Lee, KB | - |
dc.contributor.author | Yoon, SB | - |
dc.contributor.author | Choi, HM | - |
dc.contributor.author | Park, JC | - |
dc.contributor.author | Roh, JS | - |
dc.contributor.author | Sanyal, MK | - |
dc.date.accessioned | 2016-03-31T13:48:04Z | - |
dc.date.available | 2016-03-31T13:48:04Z | - |
dc.date.created | 2009-02-28 | - |
dc.date.issued | 1998-10 | - |
dc.identifier.issn | 0169-4332 | - |
dc.identifier.other | 1998-OAK-0000000466 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/20610 | - |
dc.description.abstract | Anomalous X-ray reflectivity measurements have been performed to extract electron density profile as a function of depth. Using a model independent analysis scheme based on distorted wave Born approximation, we have demonstrated that element-specific density profiles in a film can be obtained from reflectivity measurements done at two different X-ray energies, one at an absorption edge of the corresponding metal and another one away from it. The merit of this technique has been demonstrated with the results on high dielectric constant metal oxide Ta2O5 films on Si(001). Our results show different Ta profiles near interfaces for Ta2O5/Si interface and Ta2O5/SiO2 interface, implying different kinetics at these interfaces during annealing process. (C) 1998 Elsevier Science B.V. All rights reserved. | - |
dc.description.statementofresponsibility | X | - |
dc.language | English | - |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.relation.isPartOf | APPLIED SURFACE SCIENCE | - |
dc.subject | anomalous X-ray reflectivity | - |
dc.subject | element-specific density profile | - |
dc.subject | Ta2O5 thin film | - |
dc.subject | DEPOSITED TA2O5 FILMS | - |
dc.subject | DENSITY PROFILES | - |
dc.subject | LAYER | - |
dc.title | Anomalous X-ray reflectivity study of metal oxide thin films | - |
dc.type | Article | - |
dc.contributor.college | 물리학과 | - |
dc.identifier.doi | 10.1016/S0169-4332(98)00324-9 | - |
dc.author.google | BANERJEE, S | - |
dc.author.google | PARK, YJ | - |
dc.author.google | LEE, DR | - |
dc.author.google | JEONG, YH | - |
dc.author.google | LEE, KB | - |
dc.author.google | YOON, SB | - |
dc.author.google | CHOI, HM | - |
dc.author.google | PARK, JC | - |
dc.author.google | ROH, JS | - |
dc.author.google | SANYAL, MK | - |
dc.relation.volume | 136 | - |
dc.relation.issue | 1-2 | - |
dc.relation.startpage | 41 | - |
dc.relation.lastpage | 45 | - |
dc.contributor.id | 10052189 | - |
dc.relation.journal | APPLIED SURFACE SCIENCE | - |
dc.relation.index | SCI급, SCOPUS 등재논문 | - |
dc.relation.sci | SCI | - |
dc.collections.name | Journal Papers | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | APPLIED SURFACE SCIENCE, v.136, no.1-2, pp.41 - 45 | - |
dc.identifier.wosid | 000076717000007 | - |
dc.date.tcdate | 2019-01-01 | - |
dc.citation.endPage | 45 | - |
dc.citation.number | 1-2 | - |
dc.citation.startPage | 41 | - |
dc.citation.title | APPLIED SURFACE SCIENCE | - |
dc.citation.volume | 136 | - |
dc.contributor.affiliatedAuthor | Jeong, YH | - |
dc.contributor.affiliatedAuthor | Lee, KB | - |
dc.identifier.scopusid | 2-s2.0-0032181297 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 11 | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | DEPOSITED TA2O5 FILMS | - |
dc.subject.keywordPlus | DENSITY PROFILES | - |
dc.subject.keywordPlus | LAYER | - |
dc.subject.keywordAuthor | anomalous X-ray reflectivity | - |
dc.subject.keywordAuthor | element-specific density profile | - |
dc.subject.keywordAuthor | Ta2O5 thin film | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Physical | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Coatings & Films | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
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