Soft X-ray spectroscopic study of a gas-puff Z-pinch argon plasma
SCIE
SCOPUS
- Title
- Soft X-ray spectroscopic study of a gas-puff Z-pinch argon plasma
- Authors
- Kim, SH; Kim, DE; Lee, TN
- Date Issued
- 1998-08
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGI
- Abstract
- X-ray radiation characteristics of argon plasma produced by a gas-puff Z-pinch device were investigated using an X-ray crystal spectrometer, an X-ray diode, and an extreme ultraviolet (XUV) spectrometer. Using a germanium crystal we have observed spectral emission from Ar XVII produced by hot spots at the pinched stage. With the help of a 2-m grazing incidence XUV spectrometer, the spectrum of 30 to 250 Angstrom were obtained. Strong lines from Ar VIII to Ar XIII were observed with a continuum whose peak is around 120 Angstrom. The radiation energy in the spectral range is estimated to be about 23 joule which is about 0.6% of the electrical energy stored in capacitors.
- Keywords
- gas-puff Z-pinch; spectroscopy; X-ray; SPECTRA; AMPLIFICATION; DIAGNOSTICS
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/20636
- DOI
- 10.1109/27.725139
- ISSN
- 0093-3813
- Article Type
- Article
- Citation
- IEEE TRANSACTIONS ON PLASMA SCIENCE, vol. 26, no. 4, page. 1108 - 1112, 1998-08
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