Open Access System for Information Sharing

Login Library

 

Article
Cited 8 time in webofscience Cited 8 time in scopus
Metadata Downloads

Soft X-ray spectroscopic study of a gas-puff Z-pinch argon plasma SCIE SCOPUS

Title
Soft X-ray spectroscopic study of a gas-puff Z-pinch argon plasma
Authors
Kim, SHKim, DELee, TN
Date Issued
1998-08
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGI
Abstract
X-ray radiation characteristics of argon plasma produced by a gas-puff Z-pinch device were investigated using an X-ray crystal spectrometer, an X-ray diode, and an extreme ultraviolet (XUV) spectrometer. Using a germanium crystal we have observed spectral emission from Ar XVII produced by hot spots at the pinched stage. With the help of a 2-m grazing incidence XUV spectrometer, the spectrum of 30 to 250 Angstrom were obtained. Strong lines from Ar VIII to Ar XIII were observed with a continuum whose peak is around 120 Angstrom. The radiation energy in the spectral range is estimated to be about 23 joule which is about 0.6% of the electrical energy stored in capacitors.
Keywords
gas-puff Z-pinch; spectroscopy; X-ray; SPECTRA; AMPLIFICATION; DIAGNOSTICS
URI
https://oasis.postech.ac.kr/handle/2014.oak/20636
DOI
10.1109/27.725139
ISSN
0093-3813
Article Type
Article
Citation
IEEE TRANSACTIONS ON PLASMA SCIENCE, vol. 26, no. 4, page. 1108 - 1112, 1998-08
Files in This Item:
There are no files associated with this item.

qr_code

  • mendeley

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Views & Downloads

Browse