In-situ X-ray diffraction study of single-slip-conditioned copper single crystals during uniaxial deformations

Abstract

The broadening of X-ray peak profiles and movements of tensile axes were obtained simultaneously in single-slip-conditioned copper single crystals. Two types of sample showed different tensile axis movements and slip system activities. These results are in accord with the observation of slip lines with scanning electron microscopy. The broadening of the X-ray peak profiles is highly dependent on the absolute Value of g.b despite the same amount of deformation. The slope between shear stress and beta (disorder) Obtained from broadening generally shows similar trends for samples A and B. As soon as the tensile axis leaves its original stereographic triangle, beta (disorder) stops increasing in sample B. This phenomenon indicates the change of activation of(111)[(1) over bar 01] and ((1) over bar(1) over bar1)[011] slip systems.