Maximum-likelihood phase estimation in phase-shifting electronic speckle pattern interferometry and its comparison with least-squares estimation
SCIE
SCOPUS
- Title
- Maximum-likelihood phase estimation in phase-shifting electronic speckle pattern interferometry and its comparison with least-squares estimation
- Authors
- Ryu, HS; Hong, CK
- Date Issued
- 1997-05
- Publisher
- OPTICAL SOC AMER
- Abstract
- The least-squares phase-fitting method, developed recently without any statistical justification, extracts an almost noiseless phase directly from the distribution of the intensities of phase-shifted speckle interference patterns [C. K. Hong et al., Opt. Lett. 20, 931 (1995)]. We present another method that can do the same by using the statistically well-established maximum-likelihood algorithm. Numerical simulations show that the precision of the maximum-likelihood estimate is better than that of the least-squares method by 19% and that its precision essentially achieves the one given by the Cramer-Rao lower bound. The limitations of the two methods subject to the phase variation within a fitting window are also studied. (C) 1997 Optical Society of America.
- Keywords
- HOLOGRAPHY
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/21334
- DOI
- 10.1364/JOSAA.14.001051
- ISSN
- 0740-3232
- Article Type
- Article
- Citation
- JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, vol. 14, no. 5, page. 1051 - 1057, 1997-05
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