DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, HJ | - |
dc.contributor.author | Lee, JK | - |
dc.date.accessioned | 2016-03-31T14:14:56Z | - |
dc.date.available | 2016-03-31T14:14:56Z | - |
dc.date.created | 2009-02-28 | - |
dc.date.issued | 1996-12 | - |
dc.identifier.issn | 0021-4922 | - |
dc.identifier.other | 1997-OAK-0000009640 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/21407 | - |
dc.description.abstract | Some properties of pseudospark discharge in a hollow cathode are analyzed using a global model. The time-dependent volume-averaged densities of electrons and ions, and electron temperature are calculated, taking into account secondary electron emission and recombination effects. The electron current from a hollow cathode is also estimated and compared with the beam current measured in experiments. With an appropriate power factor, defined as the ratio of the energy delivered to the system to the total energy stored in the external capacitor, the simulated beam currents agree with the experimental results. The calculated beam current density is about 1 kA/cm(2) and the maximum average electron density in the cylindrical hollow cathode is estimated to be in the range of 10(14) cm(-3) under the breakdown conditions of 10-40 mTorr pressure of argon gas and 5-24 kV breakdown voltage. | - |
dc.description.statementofresponsibility | X | - |
dc.language | English | - |
dc.publisher | JAPAN J APPLIED PHYSICS | - |
dc.relation.isPartOf | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | - |
dc.subject | hollow cathode | - |
dc.subject | global model | - |
dc.subject | pseudospark discharge | - |
dc.subject | secondary electron emission | - |
dc.subject | numerical simulation | - |
dc.subject | BRIGHTNESS ELECTRON-BEAM | - |
dc.title | Time-dependent global-model simulation for a pseudospark discharge with a cylindrical hollow cathode | - |
dc.type | Article | - |
dc.contributor.college | 전자전기공학과 | - |
dc.identifier.doi | 10.1143/JJAP.35.6252 | - |
dc.author.google | LEE, HJ | - |
dc.author.google | LEE, JK | - |
dc.relation.volume | 35 | - |
dc.relation.issue | 12A | - |
dc.relation.startpage | 6252 | - |
dc.relation.lastpage | 6258 | - |
dc.contributor.id | 10158178 | - |
dc.relation.journal | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | - |
dc.relation.index | SCI급, SCOPUS 등재논문 | - |
dc.relation.sci | SCI | - |
dc.collections.name | Journal Papers | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.35, no.12A, pp.6252 - 6258 | - |
dc.identifier.wosid | A1996WF47900063 | - |
dc.date.tcdate | 2019-01-01 | - |
dc.citation.endPage | 6258 | - |
dc.citation.number | 12A | - |
dc.citation.startPage | 6252 | - |
dc.citation.title | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | - |
dc.citation.volume | 35 | - |
dc.contributor.affiliatedAuthor | Lee, JK | - |
dc.identifier.scopusid | 2-s2.0-0030416738 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 8 | - |
dc.type.docType | Article | - |
dc.subject.keywordAuthor | hollow cathode | - |
dc.subject.keywordAuthor | global model | - |
dc.subject.keywordAuthor | pseudospark discharge | - |
dc.subject.keywordAuthor | secondary electron emission | - |
dc.subject.keywordAuthor | numerical simulation | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Physics | - |
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