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Cited 2 time in webofscience Cited 1 time in scopus
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dc.contributor.authorPARK, J-
dc.contributor.authorYOON, Y-
dc.contributor.authorKIM, C-
dc.date.accessioned2016-03-31T14:25:39Z-
dc.date.available2016-03-31T14:25:39Z-
dc.date.created2009-02-28-
dc.date.issued1995-10-26-
dc.identifier.issn0013-5194-
dc.identifier.other1995-OAK-0000009260-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/21695-
dc.description.abstractThe MC scheme is considered to be a promising policing scheme due to its excellent mean rate policing capability. The authors present several numerical equations useful for analysing this scheme.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherIEE-INST ELEC ENG-
dc.relation.isPartOfELECTRONICS LETTERS-
dc.subjectASYNCHRONOUS TRANSFER MODE-
dc.subjectTELECOMMUNICATION CONGESTION CONTROL-
dc.subjectPERFORMANCE-
dc.titleANALYSIS OF MC (MOVING CEILING) SCHEME-
dc.typeArticle-
dc.contributor.college컴퓨터공학과-
dc.identifier.doi10.1049/el:19951333-
dc.author.googlePARK, J-
dc.author.googleYOON, Y-
dc.author.googleKIM, C-
dc.relation.volume31-
dc.relation.issue22-
dc.relation.startpage1892-
dc.relation.lastpage1893-
dc.contributor.id10071261-
dc.relation.journalELECTRONICS LETTERS-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationELECTRONICS LETTERS, v.31, no.22, pp.1892 - 1893-
dc.identifier.wosidA1995TE33900006-
dc.date.tcdate2019-01-01-
dc.citation.endPage1893-
dc.citation.number22-
dc.citation.startPage1892-
dc.citation.titleELECTRONICS LETTERS-
dc.citation.volume31-
dc.contributor.affiliatedAuthorKIM, C-
dc.identifier.scopusid2-s2.0-0029387014-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc2-
dc.type.docTypeArticle-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-

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Dept of Computer Science & Enginrg
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