LEAST-SQUARES FITTING OF THE PHASE MAP OBTAINED IN PHASE-SHIFTING ELECTRONIC SPECKLE PATTERN INTERFEROMETRY

Abstract

A new method has been developed to remove noise from the deformation phase map obtained by a phase-shifting electronic speckle pattern interferometry. Unlike usual methods, it estimates almost noise-free phase values directly from the distributions of the intensity differences of four interference patterns by a least-squares fit. The fluctuations of uniform deformation phases are reduced to less than 0.05 rad with a 5 x 5 pixel-fitting window. The so-called sawtooth phase jumps that are due to the use of arctangent functions are retained sharply in this method.