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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | BAEK, KH | - |
| dc.contributor.author | SUNG, HY | - |
| dc.contributor.author | PARK, WS | - |
| dc.date.accessioned | 2016-03-31T14:33:50Z | - |
| dc.date.available | 2016-03-31T14:33:50Z | - |
| dc.date.created | 2009-03-23 | - |
| dc.date.issued | 1995-01 | - |
| dc.identifier.issn | 1051-8207 | - |
| dc.identifier.other | 1995-OAK-0000009021 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/21866 | - |
| dc.description.abstract | A 3-position transmission/reflection method for measuring the permittivity of low loss materials is presented. In this method, the measurement errors of the permittivity due to 1) the mismatch at the connections, 2) the metallic loss of the holder, 3) the uncertainty of sample position in the airline, and 4) the imperfection of the calibration kit can be removed by the measured data for a sample at three different positions. Experimental results for a low loss engineering plastic (tan delta congruent-to 0.025) are included. | - |
| dc.description.statementofresponsibility | X | - |
| dc.language | English | - |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
| dc.relation.isPartOf | IEEE MICROWAVE AND GUIDED WAVE LETTERS | - |
| dc.title | A 3-POSITION TRANSMISSION REFLECTION METHOD FOR MEASURING THE PERMITTIVITY OF LOW-LOSS MATERIALS | - |
| dc.type | Article | - |
| dc.contributor.college | 전자전기공학과 | - |
| dc.identifier.doi | 10.1109/75.382378 | - |
| dc.author.google | BAEK, KH | - |
| dc.author.google | SUNG, HY | - |
| dc.author.google | PARK, WS | - |
| dc.relation.volume | 5 | - |
| dc.relation.issue | 1 | - |
| dc.relation.startpage | 3 | - |
| dc.relation.lastpage | 5 | - |
| dc.contributor.id | 10071830 | - |
| dc.relation.journal | IEEE MICROWAVE AND GUIDED WAVE LETTERS | - |
| dc.relation.index | SCI급, SCOPUS 등재논문 | - |
| dc.relation.sci | SCI | - |
| dc.collections.name | Journal Papers | - |
| dc.type.rims | ART | - |
| dc.identifier.bibliographicCitation | IEEE MICROWAVE AND GUIDED WAVE LETTERS, v.5, no.1, pp.3 - 5 | - |
| dc.identifier.wosid | A1995PZ98000002 | - |
| dc.date.tcdate | 2019-01-01 | - |
| dc.citation.endPage | 5 | - |
| dc.citation.number | 1 | - |
| dc.citation.startPage | 3 | - |
| dc.citation.title | IEEE MICROWAVE AND GUIDED WAVE LETTERS | - |
| dc.citation.volume | 5 | - |
| dc.contributor.affiliatedAuthor | PARK, WS | - |
| dc.identifier.scopusid | 2-s2.0-0029210185 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
| dc.description.wostc | 37 | - |
| dc.type.docType | Article | - |
| dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Engineering | - |
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- 박위상PARK, WEE SANG
- Dept of Electrical Enginrg